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ADC08038CIWM 数据表(PDF) 14 Page - National Semiconductor (TI) |
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ADC08038CIWM 数据表(HTML) 14 Page - National Semiconductor (TI) |
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14 / 24 page ![]() Functional Description (Continued) 4.0 THE ANALOG INPUTS The most important feature of these converters is that they can be located right at the analog signal source and through just a few wires can communicate with a controlling proces- sor with a highly noise immune serial bit stream. This in itself greatly minimizes circuitry to maintain analog signal accu- racy which otherwise is most susceptible to noise pickup. However, a few words are in order with regard to the analog inputs should the input be noisy to begin with or possibly riding on a large common-mode voltage. The differential input of these converters actually reduces the effects of common-mode input noise, a signal common to both selected “+” and “−” inputs for a conversion (60 Hz is most typical). The time interval between sampling the “+” in- put and then the “−” input is 1⁄2 of a clock period. The change in the common-mode voltage during this short time interval can cause conversion errors. For a sinusoidal common-mode signal this error is: where f CM is the frequency of the common-mode signal, V PEAK is its peak voltage value and f CLK is the A/D clock frequency. For a 60Hz common-mode signal to generate a 1⁄4 LSB error ( ≈5mV) with the converter running at 250kHz, its peak value would have to be 6.63V which would be larger than allowed as it exceeds the maximum analog input limits. Source resistance limitation is important with regard to the DC leakage currents of the input multiplexer. Bypass capaci- tors should not be used if the source resistance is greater than 1k Ω. The worst-case leakage current of ±1µA over tem- perature will create a 1mV input error with a 1k Ω source re- sistance. An op amp RC active low pass filter can provide both impedance buffering and noise filtering should a high impedance signal source be required. 5.0 OPTIONAL ADJUSTMENTS 5.1 Zero Error The zero of the A/D does not require adjustment. If the mini- mum analog input voltage value, V IN(MIN), is not ground a zero offset can be done. The converter can be made to out- put 0000 0000 digital code for this minimum input voltage by biasing any V IN (−) input at this VIN(MIN) value. This utilizes the differential mode operation of the A/D. The zero error of the A/D converter relates to the location of the first riser of the transfer function and can be measured by grounding the V IN (−) input and applying a small magnitude positive voltage to the V IN (+) input. Zero error is the differ- ence between the actual DC input voltage which is neces- sary to just cause an output digital code transition from 0000 0000 to 0000 0001 and the ideal 1⁄2 LSB value (1⁄2 LSB = 9.8mV for V REF = 5.000VDC). 5.2 Full Scale The full-scale adjustment can be made by applying a differ- ential input voltage which is 11⁄2 LSB down from the desired analog full-scale voltage range and then adjusting the mag- nitude of the V REFIN input for a digital output code which is just changing from 1111 1110 to 1111 1111. 5.3 Adjusting for an Arbitrary Analog Input Voltage Range If the analog zero voltage of the A/D is shifted away from ground (for example, to accommodate an analog input signal which does not go to ground), this new zero reference should be properly adjusted first. A V IN (+) voltage which equals this desired zero reference plus 1⁄2 LSB (where the LSB is calculated for the desired analog span, using 1 LSB = analog span/256) is applied to selected “+” input and the zero reference voltage at the corresponding “−” input should then be adjusted to just obtain the 00 HEX to 01HEX code tran- sition. The full-scale adjustment should be made [with the proper V IN (−) voltage applied] by forcing a voltage to the VIN (+) in- put which is given by: DS010555-52 a) Ratiometric DS010555-53 b) Absolute with a Reduced Span FIGURE 2. Reference Examples www.national.com 14 |
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