BTA06-800SWRG datasheet(5/6 Pages) STMICROELECTRONICS

5 / 6 page

BTA/BTB06 Series

5/6

Fig. 7: Relative variation of gate trigger current,

holding current and latching current versus

junction temperature (typical values).

Fig. 8-1: Relative variation of critical rate of

decrease of main current versus (dV/dt)c (typical

values). Snubberless & Logic Level Types

Fig. 8-2: Relative variation of critical rate of

decrease of main current versus (dV/dt)c (typical

values). Standard Types

Fig. 9: Relative variation of critical rate of

decrease

main

current

versus

junction

temperature.

-40

-20

100

120

140

0.0

0.5

1.0

1.5

2.0

2.5

IGT,IH,IL[Tj] / IGT,IH,IL [Tj=25°C]

IGT

IH & IL

Tj(°C)

0.1

1.0

10.0

100.0

0.0

0.2

0.4

0.6

0.8

1.0

1.2

1.4

1.6

1.8

2.0

2.2

2.4

(dI/dt)c [(dV/dt)c] / Specified (dI/dt)c

BW/CW

(dV/dt)c (V/µs)

0.1

1.0

10.0

100.0

0.0

0.2

0.4

0.6

0.8

1.0

1.2

1.4

1.6

1.8

2.0

(dI/dt)c [(dV/dt)c] / Specified (dI/dt)c

(dV/dt)c (V/µs)

100

125

(dI/dt)c [Tj] / (dI/dt)c [Tj specified]

Tj(°C)

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