Features

Applications

Customer Premise Equipment (CPE):

MF-R/600 Series - Telecom PTC Resettable Fuses

*RoHS Directive 2002/95/EC Jan. 27, 2003 including annex and RoHS Recast 2011/65/EU June 8, 2011.

Specifications are subject to change without notice.

The device characteristics and parameters in this data sheet can and do vary in different applications and actual device performance may vary over time.

Users should verify actual device performance in their specific applications.

Electrical Characteristics

Model

Max.

Operating

Voltage

(VDC)

Max.

Interrupt

Ratings

Hold

Current

Trip

Current

Initial Resistance

One Hour

Post-Trip

Resistance

Max. Time

To Trip @

1 A

Tripped

Power

Dissipation

Volts

Amps

Amps

at 23

°C

Amps

at 23

°C

Ohms

at 23

°C

Ohms

at 23

°C

Ohms

at 23

°C

Seconds

at 23

°C

Watts

at 23

°C

Max.

Max.

Min.

Max.

Max.

MF-R015/600

250

600

3

0.15

0.30

6.0

12.0

22.0

5.0

1.0

MF-R015/600-A

250

600

3

0.15

0.30

7.0

10.0

20.0

5.0

1.0

MF-R015/600-B

250

600

3

0.15

0.30

9.0

12.0

22.0

5.0

1.0

MF-R015/600-F

250

600

3

0.15

0.30

7.0

12.0

22.0

5.0

1.0

MF-R016/600

250

600

3

0.16

0.32

4.0

10.0

18.0

7.0

1.0

MF-R016/600-A

250

600

3

0.16

0.32

4.0

7.0

16.0

7.0

1.0

MF-R016/600-1

250

600

3

0.16

0.32

4.0

8.0

17.0

7.0

1.0

Environmental Characteristics

Operating/Storage Temperature ........................... -40 °C to +85 °C

Maximum Device Surface Temperature

in Tripped State ................................................. 125 °C

+60 °C, 1000 hours............................................... ±5 % typical resistance change

Humidity Aging...................................................... +85 °C, 85 % R.H. 500 hours ............................... ±5 % typical resistance change

Thermal Shock ..................................................... MIL-STD-202F, Method 107G,

+125 °C to -55 °C,10 times................................... ±15 % typical resistance change

Solvent Resistance............................................... MIL-STD-202, Method 215B................................. No change

Lead Solderability ................................................. ANSI/J-STD-002

Flammability ......................................................... IEC 695-2-2 .......................................................... No Flame for 60 secs.

Vibration ............................................................... MIL-STD-883C, Method 2007.1, Condition A ....... No change

Test Procedures And Requirements For Model MF-R/600 Series

Test

Test Conditions

Accept/Reject Criteria

Visual/Mech. ......................................................... Verify dimensions and materials ........................... Per MF physical description

Resistance............................................................ In still air @ 23 °C ................................................. Rmin

≤ R ≤ Rmax

Time to Trip........................................................... 1 A, Vmax, 23 °C .................................................. T

≤ max. time to trip (seconds)

Hold Current ......................................................... 30 min. at Ihold ..................................................... No trip

Trip Cycle Life....................................................... Vmax, Itrip, 100 cycles.......................................... No arcing or burning

Trip Endurance ..................................................... Vmax, 24 hours..................................................... No arcing or burning

UL File Number .................................................... E307915

TÜV File Number.................................................. R 50256529

Thermal Derating Chart - Ihold (Amps)

Model

Ambient Operating Temperature

-40 °C

-20 °C

0 °C

23 °C

40 °C

50 °C

60 °C

70 °C

85 °C

MF-R015/600

0.233

0.206

0.178

0.150

0.124

0.110

0.096

0.083

0.062

MF-R016/600

0.249

0.219

0.190

0.160

0.132

0.117

0.103

0.088

0.066

Itrip is approximately two times Ihold.