1

DSG

2

PACK

3

VCC

4

ZVCHG

5

6

PMS

7

VSS

8

REG33

9

TOUT

10

VCELL+

CHG

BAT

37

VC1

18

VC2

17

VC3

16

VC4

15

VC5

14

ASRP

13

ASRN

12

11

GPOD

19

NC

PRES

TS 2

PFIN

SAFE

SMBD

TS 1

LED4

LED5

GSRP

23

GSRN

24

25

VSS

26

REG25

27

RBI

28

VSS

29

30

31

32

33

34

35

36

38

21

20

22

SMBC

DISP

VSS

43

39

40

41

42

44

LED1

LED2

LED3

RESET

¯¯¯¯¯¯

¯¯¯¯¯

MRST

ALERT

¯¯¯¯¯¯

¯¯¯¯

¯¯¯¯

¯¯¯¯¯

NC

Coloumb

Counter

HW Over

Current &

Short Circuit

Protection

Cell Voltage

Multiplexer

N-Channel FET

Drive

Pre Charge FET

& PGOD Drive

Power Mode

Control

SMBD

DISP

VC5

VC4

VC3

VC2

VC1

¯¯¯¯¯

SMBC

¯¯¯¯¯¯

¯¯¯¯

Cell Balancing

Temperature

Measurement

LED Display

Data Flash

Memory

SMB 1.1

Impedance

Track ™

Gas Gauging

SHA-1

Authentication

Over- & Under-

Voltage

Protection

Voltage

Measurement

Over Current

Protection

Oscillator

Charging

Algorithm

Fuse Blow

Detection and

Logic

Over

Temperature

Protection

Watchdog

Regulators

RESET

ALERT

¯¯¯¯¯¯

REG33

REG25

VCELL+

MSRT

RBI

System Control

AFE HW Control

Pack -

RSNS

5m – 20m

typ.

Pack +

SMBC

SMBD

bq20z95

GND

VC4

VC3

VC2

VC1

VDD

OUT

CD

bq294xx

bq20z95

SLUS757C – JULY 2007 – REVISED OCTOBER 2013

www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

SYSTEM PARTITIONING DIAGRAM

bq20z95

DBT Package

(TOP VIEW)

2

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