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CC1100-RTR1 数据表(PDF) 84 Page - Texas Instruments

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部件名 CC1100-RTR1
功能描述  Low-Power Sub- 1 GHz RF Transceiver
PDF  100 Pages
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制造商  TI1 [Texas Instruments]
网页  http://www.ti.com
标志 TI1 - Texas Instruments

CC1100-RTR1 数据表(HTML) 84 Page - Texas Instruments

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CC1100
SWRS038D
Page 84 of 92
33.2 Configuration Register Details – Registers that Lose Programming in SLEEP State
0x29: FSTEST – Frequency Synthesizer Calibration Control
Bit
Field Name
Reset
R/W
Description
7:0
FSTEST[7:0]
89 (0x59)
R/W
For test only. Do not write to this register.
0x2A: PTEST – Production Test
Bit
Field Name
Reset
R/W
Description
7:0
PTEST[7:0]
127 (0x7F)
R/W
Writing 0xBF to this register makes the on-chip temperature sensor
available in the IDLE state. The default 0x7F value should then be
written back before leaving the IDLE state.
Other use of this register is for test only.
0x2B: AGCTEST – AGC Test
Bit
Field Name
Reset
R/W
Description
7:0
AGCTEST[7:0]
63 (0x3F)
R/W
For test only. Do not write to this register.
0x2C: TEST2 – Various Test Settings
Bit
Field Name
Reset
R/W
Description
7:0
TEST2[7:0]
136 (0x88)
R/W
The value to use in this register is given by the SmartRF® Studio
software [7].
0x2D: TEST1 – Various Test Settings
Bit
Field Name
Reset
R/W
Description
7:0
TEST1[7:0]
49 (0x31)
R/W
The value to use in this register is given by the SmartRF® Studio
software [7].
0x2E: TEST0 – Various Test Settings
Bit
Field Name
Reset
R/W
Description
7:2
TEST0[7:2]
2 (0x02)
R/W
The value to use in this register is given by the SmartRF® Studio
software [7].
1
VCO_SEL_CAL_EN
1
R/W
Enable VCO selection calibration stage when 1
0
TEST0[0]
1
R/W
The value to use in this register is given by the SmartRF® Studio
software [7].



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