25

Ω

25

Ω

25

Ω

25

Ω

25

Ω

25

Ω

25

Ω

25

Ω

25

Ω

25

Ω

Logic Control

Logic Control

3

4

5

8

9

21

20

17

16

12

1Y0

1Y1

1Y2

1Y3

1Y4

2Y0

2Y1

2Y2

2Y3

2Y4

1G

2G

CLK

11

13

24

CDCVF2310-EP

SCAS934 – DECEMBER 2012

www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

FUNCTIONAL BLOCK DIAGRAM

2

Submit Documentation Feedback

Copyright © 2012, Texas Instruments Incorporated

Product Folder Links: CDCVF2310-EP