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LMV751 数据表(PDF) 3 Page - Texas Instruments

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部件名 LMV751
功能描述  LMV751 Low Noise, Low Vos, Single Op Amp
PDF  18 Pages
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制造商  TI1 [Texas Instruments]
网页  http://www.ti.com
标志 TI1 - Texas Instruments

LMV751 数据表(HTML) 3 Page - Texas Instruments

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LMV751
www.ti.com
SNOS468E – AUGUST 1999 – REVISED MARCH 2013
2.7V Electrical Characteristics (continued)
V
+ = 2.7V, V− = 0V, V
CM = 1.35V, TA = 25°C unless otherwise stated. Boldface limits apply over the Temperature Range.
Typ
Limit
Symbol
Parameter
Condition
Units
(1)
(2)
VO
Positive Voltage Swing
RL = 10k Connect to V
+/2
2.62
2.54
2.52
V
min
RL = 2k Connect to V
+/2
2.62
2.54
2.52
VO
Negative Voltage Swing
RL = 10k Connect to V
+/2
78
140
160
mV
max
RL = 2k Connect to V
+/2
78
160
180
IO
Output Current
Sourcing, VO = 0V
12
6.0
VIN (diff) = ±0.5V
1.5
mA
min
Sinking, VO = 2.7V
11
6.0
VIN (diff) = ±0.5V
1.5
en (10Hz)
Input Referred Voltage Noise
15.5
nV/
√Hz
en (1kHz)
Input Referred Voltage Noise
7
nV/
√Hz
en (30kHz)
Input Referred Voltage Noise
7
10
nV/
√Hz max
IN(1kHz)
Input Referred Current Noise
0.01
pA/
√Hz
GBW
Gain-Bandwidth Product
4.5
2
MHZ
min
SR
Slew Rate
2
V/µs
5.0V Electrical Characteristics
V
+ = 5.0V, V− = 0V, V
CM = 2.5V, TA = 25°C unless otherwise stated.Boldface limits apply over the Temperature Range.
Typ
Limit
Symbol
Parameter
Units
(1)
(2)
VOS
Input Offset Voltage
0.05
1.0
mV
1.5
max
CMRR
Common Mode Rejection Ratio
0V < VCM < 3.6V
103
85
dB
70
min
VCM
Input Common-Mode Voltage Range
For CMRR
≥ 50dB
0
V
min
3.7
3.6
V
max
PSRR
Power Supply Rejection Ratio
V+ = 2.7V to 5.0V
107
85
dB
70
min
IS
Supply Current
0.6
0.9
mA
0.95
max
IIN
Input Current
1.5
100
pA
max
IOS
Input offset Current
0.2
pA
AVOL
Voltage Gain
RL = 10k Connect to V
+/2
120
110
db
VO = 0.2V to 4.5V
95
min
RL = 2k Connect to V
+/2
120
100
VO = 0.2V to 4.5V
85
VO
Positive Voltage Swing
RL = 10k Connect to V
+/2
4.89
4.82
4.80
V
min
RL = 2k Connect to V
+/2
4.89
4.82
4.80
VO
Negative Voltage Swing
RL = 10k Connect to V
+/2
86
160
180
mV
max
RL = 2k Connect to V
+/2
86
180
200
(1)
Typical values represent the most likely parametric norm.
(2)
All limits are ensured by testing or statistical analysis
Copyright © 1999–2013, Texas Instruments Incorporated
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