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TLC252CPWR 数据表(PDF) 16 Page - Texas Instruments |
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TLC252CPWR 数据表(HTML) 16 Page - Texas Instruments |
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16 / 26 page ![]() TLC252, TLC252A, TLC252B, TLC252Y, TLC25L2, TLC25L2A, TLC25L2B TLC25L2Y, TLC25M2, TLC25M2A, TLC25M2B, TLC25M2Y LinCMOS DUAL OPERATIONAL AMPLIFIERS SLOS002I – JUNE 1983 – REVISED MARCH 2001 16 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 PARAMETER MEASUREMENT INFORMATION single-supply versus split-supply test circuits Because the TLC252, TLC25L2, and TLC25M2 are optimized for single-supply operation, circuit configurations used for the various tests often present some inconvenience since the input signal, in many cases, must be offset from ground. This inconvenience can be avoided by testing the device with split supplies and the output load tied to the negative rail. A comparison of single-supply versus split-supply test circuits is shown below. The use of either circuit gives the same result. + – CL RL VI VO VDD + – CL RL VI VO VDD + VDD – (a) SINGLE SUPPLY (b) SPLIT SUPPLY Figure 1. Unity-Gain Amplifier (a) SINGLE SUPPLY (a) SPLIT SUPPLY + – 1/2 VDD VO VDD 2 k Ω 20 Ω 20 Ω + – VO VDD 2 k Ω 20 Ω 20 Ω VDD– Figure 2. Noise-Test Circuit (a) SINGLE SUPPLY (a) SPLIT SUPPLY + – 1/2 VDD VO VDD 10 k Ω 100 Ω CL VI + – VO VDD+ 10 k Ω 100 Ω CL VI VDD– Figure 3. Gain-of-100 Inverting Amplifier |
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