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D PACKAGE

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DESCRIPTION/ORDERING INFORMATION

LM211-EP

DIFFERENTIAL COMPARATOR WITH STROBES

SLCS140A – DECEMBER 2002 – REVISED MAY 2006

•

Controlled Baseline

•

Maximum Input Bias Current . . . 300 nA

– One Assembly/Test Site, One Fabrication

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Maximum Input Offset Current . . . 70 nA

Site

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Can Operate From Single 5-V Supply

•

Extended Temperature Performance of

–55

°C to 125°C

•

Enhanced Diminishing Manufacturing

Sources (DMS) Support

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Enhanced Product Change Notification

•

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Fast Response Times

•

Strobe Capability

(1)

Component qualification in accordance with JEDEC and

industry standards to ensure reliable operation over an

extended temperature range. This includes, but is not limited

to, Highly Accelerated Stress Test (HAST) or biased 85/85,

temperature cycle, autoclave or unbiased HAST,

electromigration, bond intermetallic life, and mold-compound

life. Such qualification testing should not be viewed as

justifying use of this component beyond specified

performance and environmental limits.

The LM211-EP is a single high-speed voltage comparator. This device is designed to operate from a wide range

of power-supply voltages, including

±15-V supplies for operational amplifiers and 5-V supplies for logic systems.

The output levels are compatible with most TTL and MOS circuits. This comparator is capable of driving lamps

or relays and switching voltages up to 50 V at 50 mA. All inputs and outputs can be isolated from system

are available, and the outputs can be wired-OR connected. If the strobe is low, the output is in the off state,

regardless of the differential input.

ORDERING INFORMATION

ORDERABLE PART NUMBER

TOP-SIDE MARKING

AT 25

°C

–40

°C to 125°C

3 mV

SOIC – D

Tape and reel

LM211QDREP

LM211E

–55

°C to 125°C

3 mV

SOIC – D

Tape and reel

LM211MDREP

LM211M

(1)

Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at

www.ti.com/sc/package.

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas

Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

PRODUCTION DATA information is current as of publication date.

Copyright © 2002–2006, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.