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DS1135LZ2012 数据表(PDF) 2 Page - Dallas Semiconductor |
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DS1135LZ2012 数据表(HTML) 2 Page - Dallas Semiconductor |
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2 / 6 page ![]() DS1135-L 2 of 6 LOGIC DIAGRAM Figure 1 PART NUMBER DELAY TABLE (tPLH , tPHL ) Table 1 TOLERANCE OVER TEMP AND VOLTAGE (Note 2) PART NUMBER DELAY PER OUTPUT (ns) INITIAL TOLERANCE (Note 1) 0°C to +70°C -40°C to +85°C DS1135LX-10 10/10/10 ±1.0ns ±2.0ns ±3.0ns DS1135LX-12 12/12/12 ±1.0ns ±2.0ns ±3.0ns DS1135LX-15 15/15/15 ±1.0ns ±2.5ns ±4.0ns DS1135LX-20 20/20/20 ±1.0ns ±2.5ns ±4.0ns DS1135LX-25 25/25/25 ±1.5ns ±3.0ns ±5.0ns DS1135LX-30 30/30/30 ±1.5ns ±3.0ns ±5.0ns NOTES: 1. Nominal conditions are +25°C and VCC = +3.3V. 2. Voltage range of 2.7V to 3.6V. 3. Delay accuracies is for both leading and trailing edges. 4. X in Part number denotes package: U indicates µSOP, Z indicates SO. TEST SETUP DESCRIPTION Figure 2 illustrates the hardware configuration used for measuring the timing parameters of the DS1135L. The input waveform is produced by a precision pulse generator under software control. Time delays are measured by a time interval counter (20 ps resolution) connected to the output. The DS1135L output taps are selected and connected to the interval counter by a VHF switch control unit. All measurements are fully automated with each instrument controlled by the computer over an IEEE 488 bus. TIME DELAY OUT IN ONE OF THREE |
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