Tel :

+44 118 979 1238

Fax :

+44 118 979 1283

Email: info@actcrystals.com

In keeping with our ongoing policy of product evolvement and improvement, the above specification is subject to change without notice.

ISO9001: 2000 Registered

For quotations or further information please contact us at:

3 The Business Centre, Molly Millars Lane, Wokingham, Berks, RG41 2EY, UK

http://www.actcrystals.com

5-2.Electronic Characteristics

Reference temperature:

Terminating source impedance:

Terminating load impedance:

Characteristic

Min.

Typ.

Max.

Units

Center Frequency

479.00

480.00

481.00

MHz

Insertion attenuation

480.00 MHz

α

(Reference level for the following data)

--

21

23.0

dB

Pass bandwidth

16.60

17.80

18.60

MHz

Relative attenuation

471.00 MHz

489.00 MHz

Lower sidelobe

430.00 ….461.00 MHz

Upper sidelobe

499.00 … 530.00 MHz

--

--

38.0

38.0

3.4

3.0

50.0

45.0

5.4

5.4

--

--

dB

dB

dB

dB

Reflected wave signal suppression

0.13

μs … 2.0μs after main pulse

40.0

46.0

--

dB

Amplitude ripple (p-p)

476.00 … 484.00 MHz

Δ α

--

0.6

1.0

dB

Group delay (aperture 0.25MHz)

480.00 MHz

τ

--

281.0

--

ns

Group delay ripple (p-p)

471.50 … 488.50 MHz

Δ

τ

--

11.5

18.0

ns

Temperature coefficient of frequency

--

-94

--

ppm/K

1.

2.

Unless noted otherwise, all measurements are made with the filter installed in the specified test fixture that is

connected to a 50

Ω test system with VSWR≤1.2:1. The test fixture L and C are adjusted for minimum insertion

the impedance matching component values and quality.

3.

Unless noted otherwise, specifications apply over the entire specified operating temperature range.

4.

The specifications of this device are based on the test circuit shown above and subject to change or

obsolescence without notice.

5.

All equipment designs utilizing this product must be approved by the appropriate government agency prior to

manufacture or sale.

6.

Our liability is only assumed for the Surface Acoustic Wave (SAW) component(s) per se, not for applications,

processes and circuits implemented within components or assemblies.

Issue : 1.1 C1

Date : March 2010