Supply Voltage

+12V to −0.2V

Output Voltage

(+V

−0.6V

Output Current

10 mA

Input Current at any pin (Note 2)

5 mA

Storage Temperature

−65˚C to +150˚C

Maximum Junction Temperature (T

+125˚C

ESD Susceptibility (Note 3) :

Human Body Model

2500V

Machine Model

250V

Lead Temperature:

SOT Package (Note 4) :

Vapor Phase (60 seconds)

+215˚C

Infrared (15 seconds)

+220˚C

Specified Temperature Range:

T

LM62B, LM62C

0˚C

≤ T

Supply Voltage Range (+V

+2.7V to +10V

Thermal Resistance,

θ

450˚C/W

Electrical Characteristics

Unless otherwise noted, these specifications apply for +V

other limits T

Parameter

Conditions

Typical

(Note 6)

LM62B

LM62C

Units

(Limit)

Limits

Limits

(Note 7)

(Note 7)

Accuracy (Note 8)

˚C (max)

+2.5/−2.0

+4.0/−3.0

˚C (max)

Output Voltage at 0˚C

+480

mV

Nonlinearity (Note 9)

˚C (max)

Sensor Gain

+16

+16.1

+16.3

mV/˚C (max)

(Average Slope)

+15.1

+14.9

mV/˚C (min)

Output Impedance

+3.0V

≤ +V

4.7

4.7

k

Ω (max)

0˚C

≤ T

4.4

4.4

k

Ω (max)

Line Regulation (Note 10)

+3.0V

≤ +V

mV/V (max)

+2.7V

≤ +V

mV (max)

Quiescent Current

+2.7V

≤ +V

82

130

130

µA (max)

165

165

µA (max)

Change of Quiescent Current

+2.7V

≤ +V

Temperature Coefficient of

0.2

µA/˚C

Quiescent Current

Long Term Stability (Note 11)

T

for 1000 hours

˚C

Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is func-

tional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see the Electrical Characteristics. The guaranteed speci-

fications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test conditions.

Note 3: The human body model is a 100 pF capacitor discharged through a 1.5 k

Ω resistor into each pin. The machine model is a 200 pF capacitor discharged di-

rectly into each pin.

Note 4: See AN-450 “Surface Mounting Methods and Their Effect on Product Reliability” or the section titled “Surface Mount” found in any post 1986 National Semi-

conductor Linear Data Book for other methods of soldering surface mount devices.

Note 5: The junction to ambient thermal resistance (

Note 7: Limits are guaranteed to National’s AOQL (Average Outgoing Quality Level).

Note 8: Accuracy is defined as the error between the output voltage and +15.6 mV/˚C times the device’s case temperature plus 480 mV, at specified conditions of

voltage, current, and temperature (expressed in ˚C).

Note 9: Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the device’s rated temperature

range.

Note 10: Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating effects can be com-

puted by multiplying the internal dissipation by the thermal resistance.

Note 11: For best long-term stability, any precision circuit will give best results if the unit is aged at a warm temperature, and/or temperature cycled for at least 46

hours before long-term life test begins. This is especially true when a small (Surface-Mount) part is wave-soldered; allow time for stress relaxation to occur. The ma-

jority of the drift will occur in the first 1000 hours at elevated temperatures. The drift after 1000 hours will not continue at the first 1000 hour rate.

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