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ADCMP350 数据表(PDF) 2 Page - Analog Devices

部件名 ADCMP350
功能描述  Comparator and Reference Circuits
PDF  4 Pages
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制造商  AD [Analog Devices]
网页  http://www.analog.com
标志 AD - Analog Devices

ADCMP350 数据表(HTML) 2 Page - Analog Devices

  ADCMP350 Datasheet HTML 1Page - Analog Devices ADCMP350 Datasheet HTML 2Page - Analog Devices ADCMP350 Datasheet HTML 3Page - Analog Devices ADCMP350 Datasheet HTML 4Page - Analog Devices  
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ADCMP350–ADCMP357
Preliminary Technical Data
Rev. PrB | Page 2 of 4
SPECIFICATIONS
(VCC=Full Operating Range, TA=-40°C to +125°C, unless otherwise noted.)
Parameter
Min
Typ
Max
Units
Test Conditions/Comments
SUPPLY
VCC Operating Voltage Range
2.25
3.6
V
VIN Operating Voltage Range
22
V
Supply Current
10
15
µA
INTERNAL REFERENCE
ADCMP350/2/4/6
0.585
0.6
0.615
V
VCC=3.3V, TA=-40°C to +85°C
0.579
0.6
0.621
V
VCC=3.3V, TA=-40°C to +125°C
ADCMP351/3/5/7
1.17
1.2
1.23
V
VCC=3.3V, TA=-40°C to +85°C
1.158
1.2
1.242
V
VCC=3.3V, TA=-40°C to +125°C
VIN HYSTERESIS
20
mV
INPUT BIAS CURRENT
10
nA
VCC=3.3V
THRESHOLD TEMPERATURE COEFFICIENT
30
ppm/ºC
VIN TO OUT DELAY
5
µs
VIN= VTH to (VTH-100mV)
OUT/OUT VOLTAGE LOW
0.3
V
VIN<VTH min, ISINK=1.2mA
OUT/OUT VOLTAGE HIGH
0.8xVcc
V
VIN>VTH max, ISOURCE=500µA
OUT/OUT OPEN-DRAIN OUTPUT LEAKAGE CURRENT
1
µA
VCC>VTH, OUT/OUT=22V
ABSOLUTE MAXIMUM RATINGS
Table 3. TA = 25°C unless otherwise noted.
Parameter
Rating
VCC
-0.3V to +6V
VIN
-0.3V to +25V
OUT, OUT (Open-Drain)
-0.3V to +25V
OUT, OUT (Push-Pull)
-0.3V to (VCC+0.3V)
Operating Temperature Range
-40°C to +125°C
Storage Temperature Range
-65°C to +150°C
θJA Thermal Impedance, SC70
146°C/W
Lead Temperature
Soldering (10 sec)
300°C
Vapour Phase (60 sec)
215°C
Infrared (15 sec)
220°C
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these or
any other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.



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