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STFI15N95K5 数据表(PDF) 5 Page - STMicroelectronics |
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STFI15N95K5 数据表(HTML) 5 Page - STMicroelectronics |
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5 / 13 page ![]() STFI15N95K5 Electrical characteristics DocID029528 Rev 1 5/13 Table 8: Source-drain diode Symbol Parameter Test conditions Min. Typ. Max. Unit ISD Source-drain current - 12 A ISDM Source-drain current (pulsed) - 48 A VSD(1) Forward on voltage ISD = 12 A, VGS = 0 V - 1.5 V trr Reverse recovery time ISD = 12 A, di/dt = 100 A/µs, VDD = 60 V (see Figure 17: "Test circuit for inductive load switching and diode recovery times") - 444 ns Qrr Reverse recovery charge - 7 µC IRRM Reverse recovery current - 32 A trr Reverse recovery time ISD = 12 A, di/dt = 100 A/µs, VDD = 60 V, Tj = 150 °C (see Figure 17: "Test circuit for inductive load switching and diode recovery times") - 630 ns Qrr Reverse recovery charge - 9.2 µC IRRM Reverse recovery current - 29 A Notes: (1)Pulsed: pulse duration = 300 µs, duty cycle 1.5% Table 9: Gate-source Zener diode Symbol Parameter Test conditions Min Typ. Max Unit V (BR)GSO Gate-source breakdown voltage IGS= ± 1 mA, ID= 0 A 30 - - V The built-in back-to-back Zener diodes are specifically designed to enhance the ESD performance of the device. The Zener voltage facilitates efficient and cost-effective device integrity protection,thus eliminating the need for additional external componentry. |
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