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STFILED627 数据表(PDF) 5 Page - STMicroelectronics

部件名 STFILED627
功能描述  N-channel 620 V, 0.95 Ω typ., 7.0 A Power MOSFET in I²PAKFP and TO-220
PDF  15 Pages
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制造商  STMICROELECTRONICS [STMicroelectronics]
网页  http://www.st.com
标志 STMICROELECTRONICS - STMicroelectronics

STFILED627 数据表(HTML) 5 Page - STMicroelectronics

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STFILED627, STPLED627
Electrical characteristics
The built-in back-to-back Zener diodes have specifically been designed to enhance not only
the device’s ESD capability, but also to make them safely absorb possible voltage transients
that may occasionally be applied from gate to source. In this respect the Zener voltage is
appropriate to achieve an efficient and cost-effective intervention to protect the device’s
integrity. These integrated Zener diodes thus avoid the usage of external components.
Table 6. Switching times
Symbol
Parameter
Test conditions
Min.
Typ.
Max. Unit
td(on)
Turn-on delay time
VDD = 310 V, ID = 2.75 A,
RG = 4.7 Ω, VGS = 10 V
(see Figure 17)
-22
-
ns
tr
Rise time
-
12
-
ns
td(off)
Turn-off-delay time
-
49
-
ns
tf
Fall time
-
20
-
ns
Table 7. Source-drain diode
Symbol
Parameter
Test conditions
Min.
Typ.
Max. Unit
ISD
Source-drain current
-
5.5
A
ISDM
(1)
1.
Pulse width limited by safe operating area.
Source-drain current (pulsed)
-
27
A
VSD
(2)
2.
Pulsed: pulse duration = 300 µs, duty cycle 1.5%.
Forward on voltage
ISD = 5.5 A, VGS = 0
-
1.5
V
trr
Reverse recovery time
ISD = 5.5 A, di/dt = 100 A/µs
VDD = 60 V (see Figure 22)
-290
ns
Qrr
Reverse recovery charge
1.9
µC
IRRM
Reverse recovery current
13.5
A
trr
Reverse recovery time
ISD = 5.5 A, di/dt = 100 A/µs
VDD = 60 V, Tj = 150 °C
(see Figure 22)
-335
ns
Qrr
Reverse recovery charge
2.4
µC
IRRM
Reverse recovery current
14.5
A
Table 8. Gate-source Zener diode
Symbol
Parameter
Test conditions
Min.
Typ.
Max. Unit
V(BR)GSO
Gate-source breakdown
voltage (ID = 0)
Igs = ± 1 mA
30
-
V
Obsolete
Product(s)
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Product(s)



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