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LM341 数据表(PDF) 4 Page - Texas Instruments |
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LM341 数据表(HTML) 4 Page - Texas Instruments |
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4 / 22 page  4 LM341, LM78M05 SNVS090F – MAY 2004 – REVISED DECEMBER 2016 www.ti.com Product Folder Links: LM341 LM78M05 Submit Documentation Feedback Copyright © 2004–2016, Texas Instruments Incorporated (1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report. 6.3 Thermal Information THERMAL METRIC(1) LM341 LM78M05 UNIT NDE (TO-220) NDP (TO-252) NDT (TO) 3 PINS 3 PINS 3 PINS RθJA Junction-to-ambient thermal resistance 22.6 38 162.4 °C/W RθJC(top) Junction-to-case (top) thermal resistance 17.8 48.4 23.9 °C/W RθJB Junction-to-board thermal resistance 6 17.7 — °C/W ψJT Junction-to-top characterization parameter 3.3 6.7 — °C/W ψJB Junction-to-board characterization parameter 6 17.9 — °C/W RθJC(bot) Junction-to-case (bottom) thermal resistance 1.3 4.4 — °C/W 6.4 Electrical Characteristics: LM341 (5 V) and LM78M05 VIN = 10 V, CIN = 0.33 µF, CO = 0.1 µF, TJ = 25°C (unless otherwise noted). Limits are specified by production testing or correlation techniques using standard Statistical Quality Control (SQC) methods. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VO Output voltage IL = 500 mA 4.8 5 5.2 V IL = 5 mA to 500 mA, PD ≤ 7.5 W, VIN = 7.5 V to 20 V, TJ = –40°C to 125°C 4.75 5 5.25 VRLINE Line regulation VIN = 7.2 V to 25 V IL = 100 mA 50 mV IL = 500 mA 100 VRLOAD Load regulation IL = 5 mA to 500 mA 100 mV IQ Quiescent current IL = 500 mA 4 10 mA ΔIQ Quiescent current change IL = 5 mA to 500 mA 0.5 mA VIN = 7.5 V to 25 V, IL = 500 mA 1 Vn Output noise voltage f = 10 Hz to 100 kHz 40 µV ΔVIN Ripple rejection f = 120 Hz, IL = 500 mA 78 dB VIN Input voltage required to maintain line regulation IL = 500 mA 7.2 V ΔVO Long-term stability IL = 500 mA, TJ = –40°C to 125°C 20 mV/khrs 6.5 Electrical Characteristics: LM341 (12 V) VIN = 19 V, CIN = 0.33 µF, CO = 0.1 µF, TJ = 25°C (unless otherwise noted). Limits are specified by production testing or correlation techniques using standard Statistical Quality Control (SQC) methods. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VO Output voltage IL = 500 mA 11.5 12 12.5 V IL = 5 mA to 500 mA, PD ≤ 7.5 W, VIN = 14.8 V to 27 V, TJ = –40°C to 125°C 11.4 12 12.6 VRLINE Line regulation VIN = 14.5 V to 30 V IL = 100 mA 120 mV IL = 500 mA 240 VRLOAD Load regulation IL = 5 mA to 500 mA 240 mV IQ Quiescent current IL = 500 mA 4 10 mA ΔIQ Quiescent current change IL = 5 mA to 500 mA 0.5 mA VIN = 14.8 V to 30 V, IL = 500 mA 1 Vn Output noise voltage f = 10 Hz to 100 kHz 75 µV ΔVIN Ripple rejection f = 120 Hz, IL = 500 mA 71 dB VIN Input voltage required to maintain line regulation IL = 500 mA 14.5 V ΔVO Long-term stability IL = 500 mA, TJ = –40°C to 125°C 48 mV/khrs |
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