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SRK2000ATR 数据表(PDF) 8 Page - STMicroelectronics |
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SRK2000ATR 数据表(HTML) 8 Page - STMicroelectronics |
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8 / 19 page ![]() Electrical characteristics SRK2000A 8/19 DocID025407 Rev 3 Symbol Parameter Test condition Min. Typ. Max. Unit Gate drive enable function VEN_On Enable threshold Positive-going edge(1) 1.7 1.8 1.9 V Hyst Hysteresis Below VEN_On -45 - mV IEN Bias current VEN = VEN_On -- 1 µA Turn-off threshold selection VEN-Th Selection threshold VCC = VCCOn 0.32 0.36 0.40 V IEN Pull-down current VEN = VEN_Th, VCC = VCCOn 710 13 µA Gate drivers VGDH Output high voltage IGDsource = 5 mA 11.75 11.9 - V IGDsource = 5 mA, VCC = 5 V 4.75 4.9 - VGDL Output low voltage IGDsink = 200 mA - 0.2 - V IGDsink = 200 mA, VCC = 5 V - 0.2 - Isourcepk Output source peak current -- -1 - A Isinkpk Output sink peak current - - 3.5 - A tf Fall time - - 18 - ns tr Rise time - - 40 - ns VGDclamp Output clamp voltage IGDsource = 5 mA; VCC = 20 V 12 13 15 V VGDL_UVLO UVLO saturation VCC = 0 to VCCon Isink = 5 mA -1 1.3 V 1. Parameters tracking each other. 2. For VCC > 30 V IDVS1,2_b may be greater than 1 µA because of the possible current contribution of the internal clamp Zener (few tens of µA). Table 5. Electrical characteristics (continued) |
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