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SPC560D30X 数据表(PDF) 33 Page - STMicroelectronics

部件名 SPC560D30X
功能描述  Non-maskable interrupt
PDF  90 Pages
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制造商  STMICROELECTRONICS [STMicroelectronics]
网页  http://www.st.com
标志 STMICROELECTRONICS - STMicroelectronics

SPC560D30X 数据表(HTML) 33 Page - STMicroelectronics

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SPC560D30x, SPC56040Dx
Electrical characteristics
Doc ID 16315 Rev 7
33/90
4.6
Thermal characteristics
4.6.1
Package thermal characteristics
4.6.2
Power considerations
The average chip-junction temperature, TJ, in degrees Celsius, may be calculated using
Equation 1:
Table 14.
LQFP thermal characteristics(1)
Symbol C
Parameter
Conditions(2)
Value
Unit
RJA CC D
Thermal resistance, junction-to-ambient natural
convection(3)
Single-layer board —1s
LQFP64
72.1
°C/W
LQFP100
65.2
Four-layer board — 2s2p
LQFP64
57.3
LQFP100
51.8
RJB CC D Thermal resistance, junction-to-board
(4)
Four-layer board — 2s2p
LQFP64
44.1
°C/W
LQFP100
41.3
RJC CC D Thermal resistance, junction-to-case
(5)
Single-layer board — 1s
LQFP64
26.5
°C/W
LQFP100
23.9
Four-layer board — 2s2p
LQFP64
26.2
LQFP100
23.7
JB
CC D
Junction-to-board thermal characterization
parameter, natural convection
Single-layer board — 1s
LQFP64
41
°C/W
LQFP100
41.6
Four-layer board — 2s2p
LQFP64
43
LQFP100
43.4
JC
CC D
Junction-to-case thermal characterization
parameter, natural convection
Single-layer board — 1s
LQFP64
11.5
°C/W
LQFP100
10.4
Four-layer board — 2s2p
LQFP64
11.1
LQFP100
10.2
1.
Thermal characteristics are targets based on simulation that are subject to change per device characterization.
2.
VDD = 3.3 V ± 10% / 5.0 V ± 10%, TA = –40 to 125 °C
3.
Junction-to-ambient thermal resistance determined per JEDEC JESD51-3 and JESD51-7. Thermal test board meets
JEDEC specification for this package. When Greek letters are not available, the symbols are typed as RthJA.
4.
Junction-to-board thermal resistance determined per JEDEC JESD51-8. Thermal test board meets JEDEC specification for
the specified package. When Greek letters are not available, the symbols are typed as RthJB.
5.
Junction-to-case at the top of the package determined using MIL-STD 883 Method 1012.1. The cold plate temperature is
used for the case temperature. Reported value includes the thermal resistance of the interface layer. When Greek letters
are not available, the symbols are typed as RthJC.



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