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TS1871 数据表(PDF) 5 Page - STMicroelectronics

部件名 TS1871
功能描述  1.8 V input/output, rail-to-rail, low power operational amplifiers
PDF  25 Pages
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制造商  STMICROELECTRONICS [STMicroelectronics]
网页  http://www.st.com
标志 STMICROELECTRONICS - STMicroelectronics

TS1871 数据表(HTML) 5 Page - STMicroelectronics

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TS187x, TS187xA
Electrical characteristics
Doc ID 6992 Rev 7
5/25
2
Electrical characteristics
Table 4.
Electrical characteristics measured at VCC+ = +1.8 V with VCC- = 0 V, CL and RL
connected to VCC/2, and Tamb = 25 °C (unless otherwise specified)
(1)
Symbol
Parameter
Conditions
Min.
Typ.
Max.
Unit
Vio
Input offset voltage
Vicm = Vout = VCC/2
TS1871A/2A/4A
Tmin ≤ Tamb ≤ Tmax
TS1871/2/4
Tmin ≤ Tamb ≤ Tmax
0.1
1
1.5
3
6
mV
ΔVio
Input offset voltage drift
2
µV/°C
Iio
Input offset current
Vicm = Vout = VCC/2
(2)
Tmin ≤ Tamb ≤ Tmax
330
60
nA
Iib
Input bias current
Vicm = Vout = VCC/2
(2)
Tmin ≤ Tamb ≤ Tmax
40
125
150
nA
CMR
Common mode rejection ratio
20 log (
ΔVic/ΔVio)
0
≤ Vicm ≤ VCC, Vout = VCC/2
Tmin ≤ Tamb ≤ Tmax
55
52
77
dB
Avd
Large signal voltage gain
Vout = 0.5 to 1.3 V
RL = 2 kΩ
RL = 600 Ω
77
70
91
84
dB
VOH
High level output voltage
Vid = 100 mV
RL = 2 kΩ
RL = 600 Ω
Tmin ≤ Tamb ≤ Tmax, RL = 2 kΩ
Tmin ≤ Tamb ≤ Tmax, RL = 600 Ω
1.65
1.62
1.65
1.62
1.77
1.74
V
VOL
Low level output voltage
Vid = -100 mV
RL = 2 kΩ
RL = 600 Ω
Tmin ≤ Tamb ≤ Tmax, RL = 2 kΩ
Tmin ≤ Tamb ≤ Tmax, RL = 600 Ω
30
46
100
150
100
150
mV
Io
Output source current
Vid = 100 mV, VO = VCC-
20
58
mA
Output sink current
Vid = -100 mV, VO = VCC+
20
68
ICC
Supply current (per amplifier)
Vout = VCC/2
AVCL = 1, no load
Tmin ≤ Tamb ≤ Tmax
400
560
600
µA
GBP
Gain bandwidth product
RL = 10 kΩ, CL = 100 pF, f = 100 kHz
0.9
1.6
MHz
SR
Slew rate
RL = 10 kΩ, CL = 100 pF, AV = 1
0.38
0.54
V/µs
φm
Phase margin
CL = 100 pF
53
Degrees
en
Input voltage noise
f = 1 kHz
27
nV/
√Hz
THD
Total harmonic distortion
0.01
%
1.
All parameter limits at temperatures different from 25 °C are guaranteed by correlation.
2.
Maximum values include unavoidable inaccuracies of the industrial tests.



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