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TSX561AIYLT 数据表(PDF) 16 Page - STMicroelectronics |
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TSX561AIYLT 数据表(HTML) 16 Page - STMicroelectronics |
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16 / 28 page ![]() Application information TSX56x, TSX56xA 16/28 DocID023274 Rev 5 5 Application information 5.1 Operating voltages The amplifiers of the TSX56x and TSX56xA series can operate from 3 V to 16 V. Their parameters are fully specified at 3.3 V, 5 V, and 16 V power supplies. However, the parameters are very stable in the full VCC range. Additionally, the main specifications are guaranteed in extended temperature ranges from -40 to 125 ° C. 5.2 Rail-to-rail input The TSX56x and TSX56xA devices are built with two complementary PMOS and NMOS input differential pairs. The devices have a rail-to-rail input, and the input common mode range is extended from (VCC-) - 0.1 V to (VCC+) + 0.1 V. However, the performance of these devices is clearly optimized for the PMOS differential pairs (which means from (VCC-) - 0.1 V to (VCC+) - 1.5 V). Beyond (VCC+) - 1.5 V, the operational amplifiers are still functional but with degraded performance, as can be observed in the electrical characteristics section of this datasheet (mainly Vio and GBP). These performances are suitable for a number of applications that need to be rail-to-rail. The devices are designed to prevent phase reversal. 5.3 Input offset voltage drift over temperature The maximum input voltage drift over the temperature variation is defined as the offset variation related to the offset value measured at 25 °C. The operational amplifier is one of the main circuits of the signal conditioning chain, and the amplifier input offset is a major contributor to the chain accuracy. The signal chain accuracy at 25 °C can be compensated during production at application level. The maximum input voltage drift over temperature enables the system designer to anticipate the effects of temperature variations. The maximum input voltage drift over temperature is computed using Equation 1. Equation 1 Where T = -40 °C and 125 °C. The datasheet maximum value is guaranteed by measurements on a representative sample size ensuring a Cpk (process capability index) greater than 2. ∆V io ∆T ma x V io T V io 25 – T 25 °C – = °C |
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