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REF3425 数据表(PDF) 12 Page - Texas Instruments |
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REF3425 数据表(HTML) 12 Page - Texas Instruments |
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12 / 25 page ![]() 6 PRE POST HYST NOM | V V | V 10 ppm V § · u ¨ ¸ © ¹ Hours 0 100 200 300 400 500 600 700 800 900 1000 -25 -15 -5 5 15 25 35 45 55 65 D015 12 REF3425 SBAS804 – SEPTEMBER 2017 www.ti.com Product Folder Links: REF3425 Submit Documentation Feedback Copyright © 2017, Texas Instruments Incorporated 7.2 Long-Term Stability One of the key parameters of the REF3425 references is long-term stability. Typical characteristic expressed as: curves shows the typical drift value for the REF3425 is 30 ppm from 0 to 1000 hours. This parameter is characterized by measuring 32 units at regular intervals for a period of 1000 hours. It is important to understand that long-term stability is not ensured by design and that the output from the device may shift beyond the typical 30 ppm specification at any time. For systems that require highly stable output voltages over long periods of time, the designer should consider burning in the devices prior to use to minimize the amount of output drift exhibited by the reference over time Figure 24. Long Term Stability - 1000 hours (VREF) 7.3 Thermal Hysteresis Thermal hysteresis is measured with the REF3425 soldered to a PCB, similar to a real-world application. Thermal hysteresis for the device is defined as the change in output voltage after operating the device at 25°C, cycling the device through the specified temperature range, and returning to 25°C. Hysteresis can be expressed by Equation 1: where • VHYST = thermal hysteresis (in units of ppm) • VNOM = the specified output voltage • VPRE = output voltage measured at 25°C pre-temperature cycling • VPOST = output voltage measured after the device has cycled from 25°C through the specified temperature range of –40°C to +125°C and returns to 25°C. (1) Typical thermal hysteresis distribution is as shown in Figure 25. |
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