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TUSB215-Q1 数据表(PDF) 6 Page - Texas Instruments |
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TUSB215-Q1 数据表(HTML) 6 Page - Texas Instruments |
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6 / 26 page ![]() tSTABLE VCC RSTN tRSTN_PULSE_WIDTH VIL(MAX) VCC(MIN) 6 TUSB215-Q1 SLLSF07 – SEPTEMBER 2017 www.ti.com Product Folder Links: TUSB215-Q1 Submit Documentation Feedback Copyright © 2017, Texas Instruments Incorporated Electrical Characteristics (continued) over operating free-air temperature and voltage range (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VIH High-level input voltage VCC = 5V 2.4 3.6 V VIM Mid-level input voltage VCC = 5V 1.6 V VIL Low-level input voltage VCC = 5V 0 0.4 V DxP, DxM CIO_DXX Capacitance to GND Measured with LCR meter and device powered down. 1 MHz sinusoid, 30 mVpp ripple 2.7 pF 6.6 Switching Characteristics over operating free-air temperature and voltage range (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT FBR_DXX DxP/M Bit Rate USB channel = HS mode; 480 Mbps traffic; VCC supply stable 480.24 Mbps tRISE_DXX DxP/M rise time 10% - 90%; VCC = 5.5V; Max AC Gain; 100 ps tFALL_DXX DxP/M fall time 90% - 10%; VCC = 5.5V; Max AC Gain; 100 ps tRSTN_PU LSE_WIDT H Minimum width to detect a valid RSTN signal assert when the pin is actively driven VCC = 4.4 V; Refer to Figure 1 20 µs tSTABLE VCC stable before RSTN de-assertion Refer to Figure 1 100 µs tVCC_RAM P VCC ramp time 0.2 100 ms Figure 1. Power On and Reset Timing |
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