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DM54LS502W/883 数据表(PDF) 1 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
部件名 DM54LS502W/883
功能描述  8 - BIT SUCCESSIVE APPROXIMATION REGISTER
PDF  6 Pages
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制造商  NSC [National Semiconductor (TI)]
网页  http://www.national.com
标志 NSC - National Semiconductor (TI)

DM54LS502W/883 数据表(HTML) 1 Page - National Semiconductor (TI)

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Original Creation Date: 04/20/98
Last Update Date: 08/24/98
Last Major Revision Date: 04/20/98
MNDM54LS502-X REV 1A0
MICROCIRCUIT DATA SHEET
8 - BIT SUCCESSIVE APPROXIMATION REGISTER
General Description
The 'LS502 is an 8-bit register with the interchange logic necessary to perform
serial-to-parallel conversion and provide an active LOW Conversion Complete (CC) signal
coincident with storage of the eighth bit.
An active LOW Start (S) input performs
synchronous initialization which forces Q7 LOW and all others HIGH.
Subsequent clocks
shift Q7 LOW signal downstream which simultaneously backfills the register such that the
first serial data (D input) bit is stored in Q7, the second bit in Q6, the third in Q5,
etc.
The serial input data is also synchronized by an auxilliary flip-flop and brought
out on QD.
Designed primarily for use in the successive approximate technique for analog-to-digital
conversion, the 'LS502 can also be used as a serial-to-parallel conversion ring counter
and as the storage and control element in recursive digital routines.
NS Part Numbers
DM54LS502J/883*
DM54LS502W/883**
Industry Part Number
54LS502
Prime Die
L502
Controlling Document
5962-9080001MEA*, MFA**
Processing
MIL-STD-883, Method 5004
Quality Conformance Inspection
MIL-STD-883, Method 5005
Subgrp Description
Temp ( C)
o
1
Static tests at
+25
2
Static tests at
+125
3
Static tests at
-55
4
Dynamic tests at
+25
5
Dynamic tests at
+125
6
Dynamic tests at
-55
7
Functional tests at
+25
8A
Functional tests at
+125
8B
Functional tests at
-55
9
Switching tests at
+25
10
Switching tests at
+125
11
Switching tests at
-55
1


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