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TLV3492AMDREP 数据表(PDF) 1 Page - Texas Instruments

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部件名 TLV3492AMDREP
功能描述  1.8 V, NANOPOWER, PUSH/PULL OUTPUT COMPARATORS
PDF  15 Pages
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制造商  TI1 [Texas Instruments]
网页  http://www.ti.com
标志 TI1 - Texas Instruments

TLV3492AMDREP 数据表(HTML) 1 Page - Texas Instruments

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FEATURES
APPLICATIONS
DESCRIPTION/ORDERING INFORMATION
TLV3491A-EP, TLV3492A-EP, TLV3494A-EP
SGDS035 – DECEMBER 2007
www.ti.com
1.8 V, NANOPOWER,
PUSH/PULL OUTPUT COMPARATORS
• Portable Medical Equipment
• Very Low Supply Current: 0.8 µA (Typical)
• Wireless Security Systems
• Input Common Mode Range 200 mV Beyond
• Remote Control Systems
Supply Rails
• Handheld Instruments
• Supply Voltage: 1.8 V to 5.5 V
• Ultra-Low Power Systems
• High Speed: 6 µs
• Push/Pull CMOS Output Stage
• Controlled Baseline
The TLV349x family of push/pull output comparators
One Assembly/Test Site, One Fabrication
features a fast 6
µs response time and <1.2 µA (max)
Site
nanopower capability, allowing operation from 1.8 V
• Extended Temperature Performance of –55°C
to 5.5 V. Input common-mode range beyond supply
to 125
°C
rails
make
the
TLV349x
an
ideal
choice
for
low-voltage applications.
• Enhanced Diminishing Manufacturing Sources
(DMS) Support
The
TLV349x
is
excellent
for
power-sensitive,
low-voltage (2-cell) applications.
• Enhanced Product Change Notification
• Qualification Pedigree
TLV349x RELATED PRODUCTS
Component qualification in accordance with JEDEC and industry
PRODUCT
FEATURES
standards to ensure reliable operation over an extended
temperature range. This includes, but is not limited to, Highly
550 nA, 2.5 V to 16 V, Push-Pull CMOS
TLV370x
Accelerated Stress Test (HAST) or biased 85/85, temperature
Output Stage Comparator
cycle, autoclave or unbiased HAST, electromigration, bond
550 nA, 2.5 V to 16 V, Open-Drain Output
intermetallic life, and mold compound life. Such qualification testing
TLV340x
Stage Comparator
should not be viewed as justifying use of this component beyond
specified performance and environmental limits.
ORDERING INFORMATION(1)
SPECIFIED
PACKAGE-
PACKAGE
PACKAGE
ORDERABLE
TRANSPORT MEDIA,
PRODUCT
TEMPERATURE
LEAD
DESIGNATOR(2)
MARKING
PART NUMBER
QUANTITY
RANGE
TLV3491
SO-8
D
–55
°C to 125°C
3491EP
TLV3491AMDREP(3)
Tape and Reel, 2500
TLV3492
SO-8
D
–55
°C to 125°C
3492EP
TLV3492AMDREP
Tape and Reel, 2500
TLV3494
SO-14
D
–55
°C to 125°C
3494EP
TLV3494AMDREP(3)
Tape and Reel, 2500
(1)
For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
website at www.ti.com.
(2)
Package drawings, thermal data, and symbolization are available at www.ti.com/packaging.
(3)
Prouct Preview. Contact your Texas Instruments Sales Representative for availability.
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
UNLESS
OTHERWISE
NOTED
this
document
contains
Copyright © 2007, Texas Instruments Incorporated
PRODUCTION DATA information current as of publication date.
Products conform to specifications per the terms of Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.


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