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AD9736BBC 数据表(PDF) 27 Page - Analog Devices |
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AD9736BBC 数据表(HTML) 27 Page - Analog Devices |
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27 / 42 page ![]() Preliminary Technical Data AD9736/AD9735/AD9734 Rev. PrJ | Page 27 of 42 AD9736 DIGITAL BUILT-IN SELF TEST BIST may be used to validate data transfer to the AD9736 in addition to final ATE device verification. There are 4 BIST signatures that can be read back using Registers 18-21 based on the setting of the BIST selection bits (REG17, bits 7:6) as shown in Table 12. SEL<1> SEL<0> 1 - LVDS Phase 1 0 0 2 - LVDS Phase 2 0 1 3 - SYNC Phase 1 1 0 4 - SYNC Phase 2 1 1 Table 12. BIST Selection Bits The BIST signature returned from the AD9736 will depend on the input DATA during the test. Since the filters in the DAC have memory, it is important to put the correct idle value on the DATA inputs to flush the memory prior to reading the BIST signature. Placing the idle value on the data inputs also allows the BIST to be setup while the DAC clock is running. The idle value should be all zeroes in unsigned mode (0x0000) and all zeroes except for the MSB in two’s complement mode (0x2000). The BIST consists of two stages; the first stage is after the LVDS receiver and the second stage is after the FIFO stage. The first BIST stage verifies correct sampling of the data from the LVDS bus while the second BIST stage verifies correct synchronization between the DAC_CLK domain and the DATA_CLK domain. The BIST vector is generated using 32 bit LFSR signature logic. Since the internal architecture is a two bus parallel system there are two 32-bit LFSR signature logic blocks on the both the LVDS and SYNC blocks. Figure 30 shows where the LVDS and SYNC phases are located. Figure 30. Block Diagram Showing LVDS and SYNC Phase 1 and Phase 2 BIST OPERATION The internal signature generator processes the input data to create the BIST signatures. An external program which implements the same algorithm may be used to generate the expected signature for comparison. A Matlab routine can be provided upon request to perform this function. Clock the test vector in as described below and compare the signature register values to the expected value to verify correct operation and input data capture. With all clocks running: 1. Apply the idle vector to the data inputs (0x0000 if unsigned, 0x2000 if two's complement) for 1024 clocks, 2. Set LVDS_EN (REG17, bit 2) and SYNC_EN (REG17, bit 1) high, 3. Set CLEAR (REG17, bit 0) high, 4. Set CLEAR low to clear the BIST signature register, 5. Clock the BIST vector into the LVDS data inputs, 6. After the BIST vector is complete, return the inputs to the idle vector value, 7. Set LVDS_EN (REG17, bit 2) and SYNC_EN (REG17, bit 1) low, 8. Set the desired SEL<1:0> bits and read back the four BIST signature registers (REG18, 19, 20 and 21). When the DAC is in 1x mode, the signature at SYNC BIST, Phase 1 should equal the signature at LVDS BIST, Phase 1. The same is true for Phase 2. BIST does not support 2x mode. LVDS RX Figure 24 DB<13:0> DATACLK_IN LVDS BIST PH1 LVDS BIST PH2 SYNC BIST PH1 SYNC BIST PH2 SYNC Logic DAC SPI Port D1 D2 FIFO 2x |
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