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TSC2302 数据表(PDF) 3 Page - Burr-Brown (TI)

[Old version datasheet] Texas Instruments acquired Burr-Brown Corporation.
部件名 TSC2302
功能描述  PROGRAMMABLE TOUCH SCREEN CONTROLLER WITH STEREO AUDIO CODEC
PDF  81 Pages
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制造商  BURR-BROWN [Burr-Brown (TI)]
网页  http://www.burr-brown.com
标志 BURR-BROWN - Burr-Brown (TI)

TSC2302 数据表(HTML) 3 Page - Burr-Brown (TI)

  TSC2302 Datasheet HTML 1Page - Burr-Brown (TI) TSC2302 Datasheet HTML 2Page - Burr-Brown (TI) TSC2302 Datasheet HTML 3Page - Burr-Brown (TI) TSC2302 Datasheet HTML 4Page - Burr-Brown (TI) TSC2302 Datasheet HTML 5Page - Burr-Brown (TI) TSC2302 Datasheet HTML 6Page - Burr-Brown (TI) TSC2302 Datasheet HTML 7Page - Burr-Brown (TI) TSC2302 Datasheet HTML 8Page - Burr-Brown (TI) TSC2302 Datasheet HTML 9Page - Burr-Brown (TI) Next Button
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TSC2302
SLAS394 – JULY 2003
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
PACKAGE/ORDERING INFORMATION
PRODUCT
PACKAGE
PACKAGE
OPERATING
ORDERING
TRANSPORT MEDIA
DESIGNATOR
TEMPERATURE
NUMBER
QUANTITY
RANGE
TSC2302IRGZ
Trays, 308
TSC2302I
QFN-48
RGZ
-40
°C to +85°C
TSC2302IRGZR
Tape and reel, 2000
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range unless otherwise noted (1)
TSC2302
Supply voltage:
AVDD, HPVDD, DVDD
4 V
Ground voltage differences:
AGND, DGND
±0.1 V
Digital input voltage
-0.3 V to (DVDD + 0.3 V)
Analog input voltage
-0.3 V to (AVDD + 0.3 V)
Ambient temperature under bias, TA
-40
°C to 125°C
Storage temperature, Tstg
-55
°C to 150°C
Junction temperature, TJ
150
°C
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds
260
°C
(1)
Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
3



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