| 制造商 | 部件名 | 数据表 | 功能描述 |
 National Semiconductor ... | SCANPSC110FDMQB |  459Kb/29P | SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
| SCANPSC110FFMQB |  459Kb/29P | SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
| SCANPSC110FLMQB |  459Kb/29P | SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
| SCANPSC110F |  459Kb/29P | SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
 National Semiconductor ... | SCANPSC110 |  459Kb/29P | SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
 National Semiconductor ... | SCAN12100 |  348Kb/14P | 1228.8 and 614.4 Mbps CPRI SerDes with Auto RE Sync and Precision Delay Calibration Measurement |
| SCAN15MB200 |  602Kb/12P | Dual 1.5 Gbps 2:1/1:2 LVDS Mux/Buffer with Pre-Emphasis and IEEE 1149.6 |
 National Semiconductor ... | SCAN15MB200TSQ |  602Kb/12P | Dual 1.5 Gbps 2:1/1:2 LVDS Mux/Buffer with Pre-Emphasis and IEEE 1149.6 |
 National Semiconductor ... | SCAN15MB200TSQX |  602Kb/12P | Dual 1.5 Gbps 2:1/1:2 LVDS Mux/Buffer with Pre-Emphasis and IEEE 1149.6 |