| 制造商 | 部件名 | 数据表 | 功能描述 |
 Bourns Electronic Solut... |
74F475AI-RC
|
429Kb/1P |
High Q, high self-resonant frequency Varnish coated
|
|
74F476AP-RC
|
429Kb/1P |
High Q, high self-resonant frequency Varnish coated
|
 NXP Semiconductors |
74F40
|
34Kb/3P |
Dual 4-input NAND buffer
April 11, 1989 |
 Fairchild Semiconductor |
74F401
|
60Kb/7P |
CRC Generator/Checker
|
|
74F401PC
|
60Kb/7P |
CRC Generator/Checker
|
|
74F401SC
|
60Kb/7P |
CRC Generator/Checker
|
 Fairchild Semiconductor |
74F402
|
63Kb/9P |
Serial Data Polynomial Generator/Checker
|
 Fairchild Semiconductor |
74F402PC
|
63Kb/9P |
Serial Data Polynomial Generator/Checker
|
|
74F403
|
167Kb/15P |
First-In First-Out (FIFO) Buffer Memory
|
|
74F403A
|
167Kb/15P |
First-In First-Out (FIFO) Buffer Memory
|
|
74F403ASPC
|
167Kb/15P |
First-In First-Out (FIFO) Buffer Memory
|
 NXP Semiconductors |
74F410
|
52Kb/5P |
Register stack 16x4 RAM 3-State output register
January 8, 1990 |
 Fairchild Semiconductor |
74F413
|
39Kb/5P |
64 x 4 First-In First-Out Buffer Memory with Parallel I/O
|