| 制造商 | 部件名 | 数据表 | 功能描述 |
 Stanford Microdevices |
SGA-9189
|
448Kb / 5P |
Reliability Qualification Report
|
|
SGA-8343X
|
178Kb / 9P |
Reliability Qualification Report
|
 List of Unclassifed Man... |
STQ-1016Z
|
216Kb / 9P |
Reliability Qualification Report
|
 California Eastern Labs |
GET-30497
|
889Kb / 24P |
Qualification Test Results on Si MMIC
|
|
GET-30569
|
4Mb / 8P |
Qualification Test Results on NE272 ser es
|
|
GET-30704
|
8Mb / 20P |
Qualification Test Results on Si MMIC
|
|
GET-BC-0004
|
606Kb / 20P |
Qualification Test Report on NE292
|
|
GET-BC-0006
|
254Kb / 4P |
Qualification Test Results on Si MMIC
|
 Hirose Electric |
TR636E-10018
|
846Kb / 40P |
COMPREHENSIVE TEST REPORT
|
 Tyco Electronics |
3-1461491-5
|
369Kb / 40P |
Qualification Test Report
|