DS3154 datasheet(32/60 Pages) DALLAS

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DS3151/DS3152/DS3153/DS3154 Single/Dual/Triple/Quad DS3/E3/STS-1 LIUs

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12.

JTAG TEST ACCESS PORT AND BOUNDARY SCAN

12.1 JTAG Description

The DS315x LIUs support the standard instruction codes SAMPLE/PRELOAD, BYPASS, and EXTEST. Optional

public instructions included are HIGHZ, CLAMP, and IDCODE. Figure 12-1 features a block diagram. The LIUs

contain the following items, which meet the requirements set by the IEEE 1149.1 Standard Test Access Port and

Boundary Scan Architecture:

Test Access Port (TAP)

TAP Controller

Instruction Register

Bypass Register

Boundary Scan Register

Device Identification Register

The TAP has the necessary interface pins, namely JTCLK,

JTRST, JTDI, JTDO, and JTMS. Details on these pins

can be found in Section 4. Details about the boundary scan architecture and the TAP can be found in IEEE 1149.1-

1990, IEEE 1149.1a-1993, and IEEE 1149.1b-1994.

Figure 12-1. JTAG Block Diagram

BOUNDARY

SCAN

IDENTIFICATION

BYPASS

INSTRUCTION

TEST ACCESS PORT

CONTROLLER

SELECT

TRI-STATE

JTDI

10k

JTMS

10k

JTCLK

JTRST

10k

JTDO

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