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N2764BU-059 数据表(PDF) 40 Page - Keysight Technologies |
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N2764BU-059 数据表(HTML) 40 Page - Keysight Technologies |
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40 / 44 page ![]() 40 | Keysight | Infiniium Z-Series Oscilloscopes - Data Sheet Hardware trigger (Continued) Maximum measurement update rate > 50,000 measurement/sec (one measurement turned on) > 250,000 measurement/sec/measurement (ten measurements turned on) Measurement modes Standard, Measure all edges mode Waveform measurements Voltage Peak to peak, minimum, maximum, average, RMS, amplitude, base, top, overshoot, preshoot, upper, middle, lower, Vovershoot, Vtime, Vpreshoot, crossing, pulse base, pulse amplitude, pulse top, PAM level mean 2, PAM level RMS 2, PAM level skew 2, PAM level thickness 2 Time Rise time, fall time, positive width, negative width, burst width, burst period, burst interval, Tmin, Tmax, Tvolt, + pulse count, - pulse count Clock Period, frequency, duty cycle to duty cycle, phase, N-period Data Setup time, hold time Mixed Area, slew rate Frequency domain FFT frequency, FFT magnitude, FFT delta frequency, FFT delta magnitude, peak detect mode Level qualification Any channels that are not involved in a measurement can be used to level-qualify all timing measurements Eye-diagram measurements Eye height, eye width, eye jitter, crossing percentage, Q factor, and duty-cycle distortion Jitter analysis measurements Requires Option 002 (or E2681A), 004 (N5400A), or 070 (N8823A). Standard on DSA Series Clock Time interval error, N-period, period to period, positive width to positive width, neg width to neg width, and duty cycle to duty cycle Data Time interval error, unit interval, N Unit Interval, unit interval to unit interval, data rate, CDR, de-emphasis Statistics Displays the current, mean, minimum, maximum, range (max-min), standard deviation, number of measurements value for the displayed automatic measurements Histograms Source Waveform or measurement Orientation Vertical (for timing and jitter measurements) or horizontal (noise and amplitude change) modes, regions are defined using waveform markers Measurements (available as a function) Mean, standard deviation, mean ± 1, 2, and 3 sigma, median, mode, peak-to-peak, min, max, total hits, peak (area of most hits), X scale hits, and X offset hits Mask testing Allows pass/fail testing to user-defined or Keysight-supplied waveform templates. Automask lets you create a mask template from a captured waveform and define a tolerance range in time/voltage or screen divisions. Test modes (run until) include test forever, test to specified time or event limit, and stop on failure. Executes “multipurpose” user setting on failure “Unfold real-time eye” feature allows individual bit errors to be observed by unfolding a real-time eye when clock recovery is on Communications mask test kit option provides a set of ITU-T G.703, ANSI T1.102, and IEEE 802.3 industry- standard masks for compliance testing Waveform math Number of functions Sixteen Hardware accelerated math operations Differential and Common Mode Absolute value, add, amplitude demodulation (radar envelope), average, Butterworth 1, common mode, delay, differentiate, divide, FFT magnitude, FFT, phase, FIR 1, high pass filter, histogram, horizontal gating, integrate, invert, LFE 1, low pass filter (4th-order Bessel Thompson filter), magnify, max, measurement trend, min, multiply, RT Eye 1, smoothing, SqrtSumOfSquare 1, square, square root, subtract, versus, and optional user defined function (Option 010) FFT Frequency range DC to 80 GHz (at 160 GSa/s) or 40 GHz (at 80 GSa/s) or 20 GHz (at 40 GSa/s) Frequency resolution Sample rate/memory depth = resolution Window modes Hanning, flattop, rectangular, Blackman-Harris, Hamming 1. Requires EZJIT Plus (Option N5400A) or EZJIT Complete (Option N8823A) software. 2. Requires PAM-4 analysis (Option N8827A) software. Specifications (Continued) |
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