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STR710F 数据表(PDF) 30 Page - STMicroelectronics |
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STR710F 数据表(HTML) 30 Page - STMicroelectronics |
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30 / 49 page ![]() STR71xF - ELECTRICAL CHARACTERISTICS 30/49 2 ELECTRICAL CHARACTERISTICS 2.1 Absolute Maximum Ratings This product contains devices to protect the inputs against damage due to high static voltages. However, it is advisable to take normal precautions to avoid application of any voltage higher than the specified maximum rated voltages. For proper operation, it is recommended that VIN and VO be higher than VSS and lower than V33. Reliability is enhanced if unused inputs are connected to an appropriate logic voltage level (V33 or VSS). Table 9. Absolute Maximum Ratings. Note Stresses exceeding above listed recommended “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. During overload conditions (VIN>V33 or VIN<VSS) the voltage on pins with respect to ground (VSS) must not exceed the recommended values. Symbol Parameter Value Unit Min Max V33 Voltage on V33 with respect to ground (VSS) -0.3 +4.0 V V33IO-PLL Voltage on V33IO-PLL with respect to ground (VSS) -0.3 +4.0 V V18 Voltage on V18 with respect to ground (VSS) -0.3 +2.0 V V18BKP Voltage on V18BKP with respect to ground (VSS) -0.3 +2.0 V AVDD Voltage on AVDD pin with respect to ground (VSS) -0.3 +4.0 V AVSS Voltage on AVSS with respect to ground (VSS) -0.1 V33 + 0.1 V VIN Voltage on true open drain pin (P0.10) with respect to ground (VSS) -0.3 +5.5 V Voltage on any other pin with respect to ground (VSS) -0.3 +4.0 IOV Input current on any pin during overload condition -10 +10 mA ITDV Absolute sum of all input currents during overload condition |200| mA TST Storage Temperature –55 +150 °C ESD ESD Susceptibility (Human Body Model) 2000 V |
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