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ADL5330ACPZ-R2 数据表(PDF) 19 Page - Analog Devices |
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ADL5330ACPZ-R2 数据表(HTML) 19 Page - Analog Devices |
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19 / 24 page ![]() Data Sheet ADL5330 Rev. B | Page 19 of 24 CDMA2000 TRANSMIT APPLICATION To test the compliance to the CDMA2000 base station standard, an 880 MHz, three-carrier CDMA2000 test model signal (forward pilot, sync, paging, and six traffic, as per 3GPP2 C.S0010-B, Table 6.5.2.1) was applied to the ADL5330. A cavity-tuned filter with a 4.6 MHz pass band was used to reduce noise from the signal source being applied to the device. Figure 46 shows the spectrum of the output signal under nominal conditions. Total POUT of the three-carrier signal is equal to 0.46 dBm and VGAIN = 1.4 V. Adjacent and alternate channel power ratio is measured in a 30 kHz bandwidth at 750 kHz and 1.98 MHz carrier offset, respectively. SPAN 15MHz CENTER 880MHz 1.5MHz/ A 1RM EXT –10 –30 –40 –20 –50 –60 –70 –80 –90 –100 –110 1 AVG 1 [T1] –18.55dBm 880MHz CH PWR 0.46dBm ACP Up –65.13dB ACP Low –64.40dB ALT1 Up –89.05dB ALT1 Low –83.68dB ALT2 Up –80.72dB ALT2 Low –81.24dB 1 CU3 CU3 CU2 CU2 CU1 CU1 CL1 CL1 CL2 CL2 CL3 CL3 C0 C0 0.4 dB OFFSET REF LVL –10dBm MARKER 1 [T1] –18.55dBm 880.00000000MHz RBW 30kHz VBW 300kHz SWT 200ms RF ATT 10dB MIXER –10dBm UNIT dBm Figure 46. 880 MHz Output Spectrum, Three-Carrier CDMA2000 Test Model at −23 dBm Total Input Power, VGAIN = 1.4 V, ACPR Measured at 750 kHz and 1.98 MHz Carrier Offset, Input Signal Filtered Using a Cavity Tuned Filter (Pass Band = 4.6 MHz) In testing, by holding the gain control voltage steady at 1.4 V, input power was swept. Figure 47 shows ACPR and noise floor vs. total output power. Noise floor is measured at 1 MHz bandwidth at 4 MHz carrier offset. –90 –0 –10 –20 –30 –40 –50 –60 –70 –80 TOTAL OUTPUT POWER (dBm) 15 –30 –25 –20 –15 –10 –5 0 5 10 –30 –50 –40 –60 –70 –80 –90 –100 –110 –120 NOISE 4MHz OFFSET ACPR 750kHz OFFSET ACPR 1.98MHz OFFSET Figure 47. ACPR vs. Total Output Power, 880 MHz Three-Carrier CDMA2000 Test Model; VGAIN = 1.4 V (Fixed), ACPR Measured in 30 kHz Bandwidth at 750 kHz and 1.98 MHz Carrier Offset The results show that up to a total output power of +8 dBm, ACPR remains in compliance with the standard (<−45 dBc at 750 kHz and <−60 dBc at 1.98 MHz). At low output power levels, ACPR at 1.98 MHz carrier offset degrades as the noise floor of the ADL5330 becomes the dominant contributor to measured ACPR. Measured noise at 4 MHz carrier offset begins to increase sharply above 0 dBm output power. This increase is not due to noise but results from increased carrier-induced distortion. As output power drops below 0 dBm total, the noise floor drops towards −85 dBm. With a fixed input power of −23 dBm, the output power was again swept by exercising the gain control input. VGAIN was swept from 0 V to 1.4 V. The resulting total output power, ACPR, and noise floor are shown in Figure 48. –100 –30 –40 –50 –60 –70 –80 –90 VGAIN (V) 1.4 0 0.2 0.4 0.6 0.8 1.0 1.2 10 0 –10 –20 –30 –40 –50 –60 NOISE 4MHz OFFSET ACPR 750kHz OFFSET ACPR 1.98MHz OFFSET OUTPUT POWER Figure 48. Total Output Power and ACPR vs. VGAIN, 880 MHz Three-Carrier CDMA2000 Test Model at −23 dBm Total Input Power; ACPR Measured in 30 kHz Bandwidth at 750 kHz and 1.98 MHz Carrier Offset Above VGAIN = 0.4 V, the ACPR is still in compliance with the standard. As the gain control input drops below 1.0 V, the noise floor drops below −90 dBm. SOLDERING INFORMATION On the underside of the chip scale package, there is an exposed compressed paddle. This paddle is internally connected to the chip’s ground. Solder the paddle to the low impedance ground plane on the printed circuit board to ensure specified electrical performance and to provide thermal relief. It is also recommended that the ground planes on all layers under the paddle be stitched together with vias to reduce thermal impedance. |
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