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EN29F080 数据表(PDF) 21 Page - List of Unclassifed Manufacturers |
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EN29F080 数据表(HTML) 21 Page - List of Unclassifed Manufacturers |
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21 / 37 page ![]() 4800 Great America Parkway, Suite 202 Tel: 408-235-8680 Santa Clara, CA 95054 Fax: 408-235-8685 21 EN29F080 Rev. C, Issue Date: 2001/07/05 Test Conditions Test Specifications Test Conditions -45 -55 -70 -90 Unit Output Load 1 TTL Gate Output Load Capacitance, CL 30 30 100 100 pF Input Rise and Fall times 5 5 20 20 ns Input Pulse Levels 0.0-0.3 0.0-0.3 0.45-2.4 0.45-2.4 V Input timing measurement reference levels 1.5 1.5 0.8, 2.0 0.8, 2.0 V Output timing measurement reference levels 1.5 1.5 0.8, 2.0 0.8, 2.0 V Device Under Test CL 6.2 k Ω 2.7 k Ω 5.0 V Note: Diodes are IN3064 or equivalent |
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