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ACPL-P302 数据表(PDF) 7 Page - Broadcom Corporation. |
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ACPL-P302 数据表(HTML) 7 Page - Broadcom Corporation. |
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7 / 15 page ![]() Broadcom Confidential - 7 - ACPL-P302/ACPL-W302 Data Sheet Package Characteristics Parameter Symbol Device Min. Typ. Max. Unit Test Conditions Fig. Note Input-Output Momentary Withstand Voltage VISO ACPL-P302 3750 Vrms TA = 25°C, RH < 50% for 1 min. 8, 10 ACPL-W302 5000 9, 10 Input-Output Resistance RI-O 1012 VI-O = 500V 10 Input-Output Capacitance CI-O 0.6 pF Freq=1 MHz Notes: 1. Derate linearly above 70°C free air temperature at a rate of 0.3 mA/°C. 2. Maximum pulse width = 10 μs, maximum duty cycle = 0.2%. This value is intended to allow for component tolerances for designs with IO peak minimum = 0.2A. See Application section for additional details on limiting IOL peak. 3. Derate linearly above 85°C, free air temperature at the rate of 4.0 mW/°C. 4. Input power dissipation does not require derating. 5. Maximum pulse width = 50 μs, maximum duty cycle = 0.5%. 6. In this test, VOH is measured with a DC load current. When driving capacitive load VOH will approach VCC as IOH approaches zero amps. 7. Maximum pulse width = 1 ms, maximum duty cycle = 20%. 8. In accordance with UL 1577, each optocoupler is proof tested by applying an insulation test voltage > 4500VRMS for 1 second (leakage detection current limit II-O < 5 μA). This test is performed before 100% production test for partial discharge (method B) shown in the IEC/EN/DIN EN 60747-5-5 Insulation Characteristics Table, if applicable. 9. In accordance with UL 1577, each optocoupler is proof tested by applying an insulation test voltage > 6000VRMS for 1 second (leakage detection current limit II-O < 5A). This test is performed before 100% production test for partial discharge (method B) shown in the IEC/EN/DIN EN 60747-5-5 Insulation Characteristics Table, if applicable. 10. Device considered a two-terminal device: pins on input side shorted together and pins on output side shorted together. 11. PDD is the difference between tPHL and tPLH between any two parts or channels under the same test conditions. 12. Common mode transient immunity in the high state is the maximum tolerable |dVCM/dt| of the common mode pulse VCM to assure that the output will remain in the high state (i.e. VO > 15.0 V). 13. Common mode transient immunity in a low state is the maximum tolerable |dVCM/dt| of the common mode pulse, VCM, to assure that the output will remain in a low state (i.e. VO < 1.0 V). 14. This load condition approximates the gate load of a 1200 V/20 A IGBT. 15. The power supply current increases when operating frequency and Qg of the driven IGBT increases. |
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