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STP4N150 数据表(PDF) 3 Page - STMicroelectronics |
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STP4N150 数据表(HTML) 3 Page - STMicroelectronics |
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3 / 11 page ![]() 3/11 STP4N150 - STW4N150 ELECTRICAL CHARACTERISTICS (CONTINUED) Table 7: Dynamic Table 8: Source Drain Diode (1) Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %. (2) Pulse width limited by safe operating area. Symbol Parameter Test Conditions Min. Typ. Max. Unit gfs (1) Forward Transconductance VDS = 30 V , ID = 2 A 3.5 S Ciss Coss Crss Input Capacitance Output Capacitance Reverse Transfer Capacitance VDS = 25 V, f = 1 MHz, VGS = 0 1300 120 12 pF pF pF td(on) tr td(off) tf Turn-on Delay Time Rise Time Turn-off-Delay Time Fall Time VDD = 750 V, ID = 2 A, RG = 4.7 Ω, VGS = 10 V (see Figure 19) 35 30 45 45 ns ns ns ns Qg Qgs Qgd Total Gate Charge Gate-Source Charge Gate-Drain Charge VDD = 600 V, ID = 4 A, VGS = 10 V (see Figure 22) 30 10 9 50 nC nC nC Symbol Parameter Test Conditions Min. Typ. Max. Unit ISD ISDM (2) Source-drain Current Source-drain Current (pulsed) 4 12 A A VSD (1) Forward On Voltage ISD = 4 A, VGS = 0 2V trr Qrr IRRM Reverse Recovery Time Reverse Recovery Charge Reverse Recovery Current ISD = 4 A, di/dt = 100 A/µs VDD = 45V (see Figure 20) 510 3 12 ns µC A trr Qrr IRRM Reverse Recovery Time Reverse Recovery Charge Reverse Recovery Current ISD = 4 A, di/dt = 100 A/µs VDD = 45V, Tj = 150°C (see Figure 20) 650 4 12.6 ns µC A |
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