10. Electrical Characteristics

PARAMETER

TEST CONDITIONS

MIN.

TYP.

MAX.

UNIT

Analog-to-Digital Converter

Zero Input Reading

VIN=0V, Vref=500mV , CYS=01

-15

15

μ

V

Linearity (Max. deviation from best

straight line fit)

VIN= ± 0.9 Vref, Vref=500mV ,

CYS=01

-25

25

μ

V

Input Common-Mode Rejection Ratio VCM=AGND

±

1V,

VIN=0.25V,

Vref=500mV

150

μ

V/V

Noise (p-p Value not Exceeding 95%

of Time)

VIN=0V, 500mV Scale

5

10

μ

V

Rollover Error (Difference in reading

for equal positive and negative inputs

near Full Scale)

-VIN=+VIN=500.00mV

0

10

50

μ

V

Scale Factor Temperature Coefficient VIN=500.00mV, -10℃<TA<+50℃

10

ppm/℃

Current Consumption

0.7

1.2

mA

Instrumentation Amplifier

Input Offset Voltage without chopper Rs<100Ω

1

mV

Input Offset Voltage with chopper

Rs<100Ω

30

μ

V

Input Referred Noise without chopper Rs=100Ω, 0.1Hz~1Hz

1

μ

Vpp

Input Referred Noise with chopper

Rs=100Ω, 0.1Hz~1Hz

0.3

μ

Vpp

Input Bias Current

[2]

100

300

pA

Input Common-Mode Voltage Range

2

3

V

Current Consumption

200

300

μ

A

General Electrical Characteristics

VDD Operating Current

Enable ADC, OPAMP

1

2

mA

Sleep Current

Disable OSC, AGND

1

5

μ

A

VS switch resister

20

Ω

Digital Output High

IOUT=-1mA

4.7

V

Digital Output Low

IOUT=1mA

0.3

V

Digital Input High

3.5

V

Digital Input Low

1.5

V

[1] These parameters are guaranteed by design and are tested only by sampling while mass production.

[2] While a voltage source with large output impedance is measured by an instrumentation amplifier having

input bias current, an additional input offset voltage will be introduced. However, this offset voltage could

be cancelled by mirrored offset cancellation technique.