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TPS16632RGET 数据表(PDF) 18 Page - Texas Instruments |
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TPS16632RGET 数据表(HTML) 18 Page - Texas Instruments |
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18 / 42 page ![]() VOUT IIN IMON FLTb VOUT IIN IMON FLTb 18 TPS1663 SLVSET9C – SEPTEMBER 2018 – REVISED MARCH 2019 www.ti.com Product Folder Links: TPS1663 Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Feature Description (continued) • R(ILIM) is the current limit resistor in kΩ (4) During the overload current limiting if the overload condition exists for more than tCL_PLIM_FLT(dly), 1.3 msec (typical), the FLT asserts to warn of impending turnoff of the internal FETs due to the subsequent thermal shutdown event or due to tCL_PLIM(dly) timer expiry. The FLT signal remains asserted until the fault condition is removed and the device resumes normal operation. Figure 20 and Figure 21 illustrate Overload current limiting performance. VIN = 50 V MODE = GND RILIM = 18 kΩ Figure 20. Overload Performance During Load Step from 140 Ω to 40 Ω VIN = 50 V MODE = GND RILIM = 18 kΩ Figure 21. Coming Out of Overload with Load Step from 40 Ω to 140 Ω The TPS1663x devices feature ILIM pin short and open fault detection and protection. The internal FET is turned OFF when ILIM pin is detected short or open to GND and it remains OFF till the ILIM pin fault is removed. 9.3.4.2 Short Circuit Protection During a transient output short circuit event, the current through the device increases rapidly. As the current-limit amplifier cannot respond quickly to this event due to its limited bandwidth, the device incorporates a fast-trip comparator. The fast-trip comparator architecture is designed for fast turn OFF tFASTTRIP(dly) = 1 µs (typical) with I(SCP) = 45 A of the internal FET during an output short circuit event. The fast-trip threshold is internally set to I(FASTTRIP). The fasttrip circuit holds the internal FET off for only a few microseconds, after which the device turns back on slowly, allowing the current-limit loop to regulate the output current to I(OL). Then the device functions similar to the overload condition. Figure 22 illustrates output hot-short performance of the device. |
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