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TPS1663 数据表(PDF) 15 Page - Texas Instruments

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部件名 TPS1663
功能描述  TPS1663x 60-V, 6-A eFuse with Adjustable Output Power Limiting
PDF  43 Pages
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制造商  TI1 [Texas Instruments]
网页  http://www.ti.com
标志 TI1 - Texas Instruments

TPS1663 数据表(HTML) 15 Page - Texas Instruments

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u
u
D(INRUSH)
(IN)
(INRUSH)
P
0.5 V
I
VIN
VOUT
PGOOD
IIN
15
TPS1663
www.ti.com
SLVSET9D – SEPTEMBER 2018 – REVISED AUGUST 2019
Product Folder Links: TPS1663
Submit Documentation Feedback
Copyright © 2018–2019, Texas Instruments Incorporated
Feature Description (continued)
CdVdT = 100 nF
COUT = 1000 µF
RILIM = 4.02 kΩ
Figure 15. Hot Plug In and Inrush Current Control at 24-V Input
9.3.1.1 Thermal Regulation Loop
The average power dissipation within the eFuse during power up with a capacitive load can be calculated using
Equation 3.
(3)
System designs requiring to charge large output capacitors rapidly may result in an operating point that exceeds
the power dissipation versus time boundary limits of the device defined by Figure 13 characteristic curve. This
may result in increase in junction temperature beyond the device's maximum allowed junction temperature. To
keep the junction temperature within the operating range, the thermal regulation control loop regulates the
junction temperature at T(J_REG) , 145°C (typical) by controlling the inrush current profile and thereby limiting the
power dissipation within the device automatically. An internal 1.25 sec (typical), t(Treg_timeout) timer starts from the
instance the thermal regulation operation kicks in. If the output does not power up within this time then the
internal FET is turned OFF. Subsequent operation of the device depends on the MODE configuration (Auto-Retry
or latch OFF) setting as per the Table 1. The maximum time-out of 1.25 sec (typical) in thermal regulation loop
operation ensures that the device and the system board does not heat up during steady fault conditions such as
wake up with output short-circuit. This scheme ensures reliable power up operation.
Thermal regulation control loop is internally enabled during power up by V(IN), UVLO cycling and turn ON using
SHDN contol. Figure 16 illustrates performance of the device operating in thermal regulation loop during power
up by V(IN) with a large output capacitor. The Thermal regulation loop gets disabled internally after the power up
sequence when the internal FET's gate gets fully enhanced or when the t(Treg_timeout) of 1.25 sec (typical) time is
elapsed.



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