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TMP6131DECR 数据表(PDF) 4 Page - Texas Instruments |
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TMP6131DECR 数据表(HTML) 4 Page - Texas Instruments |
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4 / 36 page ![]() 4 TMP61 SBOS921C – DECEMBER 2018 – REVISED SEPTEMBER 2019 www.ti.com Product Folder Links: TMP61 Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. Theseare stress ratings only, which do not imply functional operation of the device at these or anyother conditions beyond those indicated under Recommended OperatingConditions. Exposure to absolute-maximum-rated conditions for extended periods mayaffect device reliability. 7 Specifications 7.1 Absolute Maximum Ratings over operating free-air temperature range (unless otherwise noted) (1) MIN MAX UNIT Voltage across the device 6 V Junction temperature (TJ) -40 150 °C Current through the device 450 µA Storage temperature (Tstg) -65 150 °C (1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. (2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. 7.2 ESD Ratings VALUE UNIT V(ESD) Electrostatic discharge Human-body model (HBM) per JESD22-A114(1) ±2000 V V(ESD) Electrostatic discharge Charged-device model (CDM), per JEDEC specification JESD22-C101 (2) ±1000 V 7.3 Recommended Operating Conditions over operating free-air temperature range (unless otherwise noted) MIN NOM MAX UNIT VSns Voltage Across Pins 2 (+) and 1 (–) 0 5.5 V ISns Current passing through the device 0 400 µA TA Operating free-air temperature (specified performance) (X1SON/DEC Package) –40 125 °C TA Operating free-air temperature (specified performance) (TO-92S/LPG Package) –40 150 °C TA Operating free-air temperature (specified performance) (SOT-5X3/DYA Package) –40 125 °C (1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report. (2) For information on self-heating and thermal response time see Layout Guidelines section. (3) The junction to ambient thermal resistance (RθJA ) under natural convection is obtained in a simulation on a JEDEC-standard, High-K board as specified in JESD51-7, in an environment described in JESD51-2. Exposed pad packages assume that thermal vias are included in the PCB, per JESD 51-5. (4) Changes in output due to self heating can be computed by multiplying the internal dissipation by the thermal resistance. 7.4 Thermal Information THERMAL METRIC(1)(2) TMP61 UNIT DEC (X1SON) LPG (TO-92) DYA (SOT-5X3) 2 PINS 2 PINS 2 PINS RθJA Junction-to-ambient thermal resistance(3)(4) 443.4 215 742.9 °C/W RθJC(top) Junction-to-case (top) thermal resistance 195.7 99.9 315.8 °C/W RθJB Junction-to-board thermal resistance 254.6 191.7 506.2 °C/W ΨJT Junction-to-top characterization parameter 19.9 35.1 109.3 °C/W YJB Junction-to-board characterization parameter 254.5 191.7 500.4 °C/W |
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