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TPS16632RGET 数据表(PDF) 18 Page - Texas Instruments

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部件名 TPS16632RGET
功能描述  TPS1663x 60-V, 6-A eFuse with Adjustable Output Power Limiting
PDF  43 Pages
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制造商  TI1 [Texas Instruments]
网页  http://www.ti.com
标志 TI1 - Texas Instruments

TPS16632RGET 数据表(HTML) 18 Page - Texas Instruments

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VOUT
IIN
IMON
FLTb
VOUT
IIN
IMON
FLTb
18
TPS1663
SLVSET9D – SEPTEMBER 2018 – REVISED AUGUST 2019
www.ti.com
Product Folder Links: TPS1663
Submit Documentation Feedback
Copyright © 2018–2019, Texas Instruments Incorporated
Feature Description (continued)
R(ILIM) is the current limit resistor in kΩ
(4)
During the overload current limiting if the overload condition exists for more than tCL_PLIM_FLT(dly), 1.3 msec
(typical), the FLT asserts to warn of impending turnoff of the internal FETs due to the subsequent thermal
shutdown event or due to tCL_PLIM(dly) timer expiry. The FLT signal remains asserted until the fault condition is
removed and the device resumes normal operation. Figure 20 and Figure 21 illustrate Overload current limiting
performance.
VIN = 50 V
MODE = GND
RILIM = 18 kΩ
Figure 20. Overload Performance During Load Step from
140 Ω to 40 Ω
VIN = 50 V
MODE = GND
RILIM = 18 kΩ
Figure 21. Coming Out of Overload with Load Step from
40 Ω to 140 Ω
The TPS1663x devices feature ILIM pin short and open fault detection and protection. The internal FET is turned
OFF when ILIM pin is detected short or open to GND and it remains OFF till the ILIM pin fault is removed.
9.3.4.2 Short Circuit Protection
During a transient output short circuit event, the current through the device increases rapidly. As the current-limit
amplifier cannot respond quickly to this event due to its limited bandwidth, the device incorporates a fast-trip
comparator. The fast-trip comparator architecture is designed for fast turn OFF tFASTTRIP(dly) = 1 µs (typical) with
I(SCP) = 45 A of the internal FET during an output short circuit event. The fast-trip threshold is internally set to
I(FASTTRIP). The fasttrip circuit holds the internal FET off for only a few microseconds, after which the device turns
back on slowly, allowing the current-limit loop to regulate the output current to I(OL). Then the device functions
similar to the overload condition. Figure 22 illustrates output hot-short performance of the device.



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