Power measurements (optional)

Power quality measurements

Switching loss measurements

Power loss

Energy loss

Harmonics

THD-F, THD-R, RMS measurements. Graphical and table displays of harmonics. Test to IEC61000-3-2 Class A and MIL-

STD-1399, Section 300A.

Ripple measurements

Modulation analysis

Graphical display of +Pulse Width, -Pulse Width, Period, Frequency, +Duty Cycle, and -Duty Cycle modulation types.

Safe operating area

Graphical display and mask testing of switching device safe operating area measurements.

dV/dt and dI/dt measurements

Cursor measurements of slew rate

Limit/Mask testing (optional)

Test source

Limit test: Any Ch1 - Ch4 or any R1 - R4

Mask test: Any Ch1 - Ch4

Mask creation

Limit test vertical tolerance from 0 to 1 division in 1 m division increments; Limit test horizontal tolerance from 0 to 500 m division in

1 m division increments.

Load custom mask from text file with up to 8 segments.

Mask scaling

Lock to Source ON (mask automatically re-scales with source-channel settings changes)

Lock to Source OFF (mask does not re-scale with source-channel settings changes)

Test criteria run until

Minimum number of waveforms (from 1 to 1,000,000 and Infinity)

Minimum elapsed time (from 1 second to 48 hours and Infinity)

Violation threshold

From 1 to 1,000,000 and Infinity

Actions on test failure

Stop acquisition, save screen image to file, save waveform to file, print screen image, AUX OUT pulse, set remote interface SRQ

Actions on test complete

AUX OUT pulse, set remote interface SRQ

Results display

Test status, total waveforms, number of violations, total tests, failed tests, elapsed time, total hits for each mask segment

Datasheet

22 www.tek.com