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BULT116D 数据表(PDF) 2 Page - STMicroelectronics |
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BULT116D 数据表(HTML) 2 Page - STMicroelectronics |
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2 / 6 page ![]() THERMAL DATA Rthj-case Rthj-amb Thermal Resistance Junction-Case Max Thermal Resistance Junction-Ambient Max 2.78 80 oC/W oC/W ELECTRICAL CHARACTERISTICS (Tcase = 25 oC unless otherwise specified) Symbol Parameter Test Conditions Min. Typ. Max. Unit ICES Collector Cut-off Current (VBE = 0) VCE = 400 V VCE = 400 V Tc = 125 oC 100 500 µA µA VEBO Emitter-Base Voltage (IC = 0) IE = 10 mA 9 V VCEO(sus) ∗ Collector-Emitter Sustaining Voltage (IB = 0) IC = 100 mA 200 V ICEO Collector Cut-off Current (IB = 0) VCE = 200 V 250 µA VCE(sat) ∗ Collector-Emitter Saturation Voltage IC = 0.5 A IB = 50 mA IC = 1 A IB = 0.1 A IC = 3 A IB = 0.6 A IC = 5 A IB = 1 A 0.25 0.4 0.7 1.2 V V V V VBE(sat) ∗ Base-Emitter Saturation Voltage IC = 1 A IB = 0.1 A IC = 5 A IB = 1 A 1.1 1.5 V V hFE ∗ DC Current Gain IC = 10 mA VCE = 5 V IC = 5 A VCE = 5 V 10 820 tr tf ts RESISTIVE LOAD Rise Time Fall Time Storage Time VCC = 125 V IC = 2 A IB1 = 0.4 A IB2 = -0.4 A tp = 30 µs (see figure 2) 0.2 0.2 1.4 0.4 µs µs µs ts tf INDUCTIVE LOAD Storage Time Fall Time IC = 2 A IB1 = 0.4 A VBE = -5 V L = 500 µH Vclamp = 180 V (see figure 1) 0.5 0.1 µs µs VF Diode Forward Voltage IC = 2 A 1.5 V ∗ Pulsed: Pulse duration = 300 µs, duty cycle 1.5 % Safe Operating Area Derating Curve BULT116D 2/6 |
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