CDDFN5-0504N - TVS/Steering Diode Array

Specifications are subject to change without notice.

Users should verify actual device performance in their specific applications.

AVHT Series - High Temperature Automotive Grade Varistors

Reliability Testing Procedures

Varistor test procedures comply with CECC 42200, IEC 1051-1/2 and AEC-Q200. Test results are available upon customer request.

Special tests can be performed upon customer request.

Reliability Parameter

Test

Tested According to

Condition to be

Satisfied after

Testing

AC/DC Bias Reliability

AC/DC Life Test

CECC 42200, Test 4.20 or

IEC 1051-1, Test 4.20,

AEC-Q200 Test 8 - 1000 h at UCT

|δVn (1 mA)| < 10 %

Pulse Current Capability

Imax 8/20 µs

CECC 42200, Test C 2.1 or

IEC 1051-1, Test 4.5

10 pulses in the same direction at

2 pulses per minute at maximum peak current for 10 pulses

|δVn (1 mA)| < 10 %

no visible damage

Pulse Energy Capability

Wmax 10/1000 µs

CECC 42200, Test C 2.1 or

IEC 1051-1, Test 4.5

10 pulses in the same direction at

1 pulse every 2 minutes at maximum peak current for 10

pulses

|δVn (1 mA)| < 10 %

no visible damage

WLD Capability

WLD x 10

ISO 7637, Test pulse 5, 10 pulses at rate of 1 per minute

|δVn (1 mA)| < 15 %

no visible damage

Vjump Capability

Vjump 5 min.

Increase of supply voltage to V ≥ Vjump for 1 minute

|δVn (1 mA)| < 15 %

no visible damage

Environmental and

Storage Reliability

Climatic Sequence

CECC 42200, Test 4.16 or

IEC 1051-1, Test 4.17

a) Dry heat, 16h, UCT, Test Ba, IEC 68-2-2

b) Damp heat, cyclic, the first cycle: 55 °C, 93 % RH, 24 h,

Test Db 68-2-4

c) Cold, LCT, 2 h, Test Aa, IEC 68-2-1

d) Damp heat cyclic, remaining 5 cycles: 55 °C, 93 % RH,

24 h/cycle, Test Bd, IEC 68-2-30

|δVn (1 mA)| < 10 %

Thermal Shock

CECC 42200, Test 4.12, Test Na, IEC 68-2-14,

AEC-Q200 Test 16, 5

|δVn (1 mA)| < 10 %

no visible damage

Steady State

Damp Heat

CECC 42200, Test 4.17, Test Ca, IEC 68-2-3,

AEC-Q200 Test 6, 56 days, 40 °C, 93 % RH,

AEC-Q200 Test 7: Bias, Rh, T all at 85.

|δVn (1 mA)| < 10 %

Storage Test

IEC 68-2-2, Test Ba, AEC-Q200 Test 3, 1000 h at maximum

storage temperature

|δVn (1 mA)| < 5 %

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