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L99LD02 数据表(PDF) 59 Page - STMicroelectronics |
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L99LD02 数据表(HTML) 59 Page - STMicroelectronics |
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59 / 66 page ![]() DS12448 Rev 3 59/66 L99LD02 Electrical specifications 64 Table 40. SDO output Symbol Parameter Test conditions Min Typ Max Unit VOUT_L Output voltage low threshold Iout = 4 mA 0.2 * VDD V VOUT_H Output voltage high threshold Iout = −4 mA 0.8 * VDD V IOUT_LEAK Output leakage current VOUT = 0 V -5 5 µA Table 41. SPI timing Symbol Parameter Test conditions Min Typ Max Unit tsck Serial clock (SCK) period 250 ns tHsck SCK high time 100 ns tLsck SCK low time 100 ns trise_in CSN, SCK, SDI rise time Fsck = 4MHz 25 ns tfall_in CSN, SCK, SDI fall time Fsck = 4MHz 25 ns tHcsn CSN high time 6 µs tScsn CSN setup time, CSN low before SCK rising 100 ns tSsck SCK setup time, SCK low before CSN rising 100 ns tSsdi SDI setup time before SCK rising 25 ns thold_sdi SDI hold time 25 ns tcsn_v CSN falling until SDO valid Cout = 50pF; Iout = ±1mA 100 ns tcsn_t CSN rising until SDO tristate Cout = 50pF; Iout = ±4mA 100 ns tsck_v SCK falling until SDO valid Cout = 50pF 60 ns tRsdo SDO rise time Guaranteed by scan and frequency oscillator (20 MHz, typical) 100 ns tFsdo SDO fall time Guaranteed by scan and frequency oscillator (20 MHz, typical) 100 ns tcsn_low_t CSN low timeout 20 35 50 ms |
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