Symbol

Parameter

Test condition

Max.

Unit

Ncycle

Write cycle endurance (1)

4,000,000

Write cycles (2)

1.200.000

1. The Write cycle endurance is defined by characterization and qualification.

2. A Write cycle is executed when either a page write, or a byte write or a write chip enable register instruction

is decoded.

Parameter

Test condition

Min.

Unit

Data retention (1)

200

Year

Cycling

4 million

Cycle

1. The data retention behaviour is checked in production, while the data retention limit defined in this table is extracted from

characterization and qualification results.

Symbol

Parameter

Test conditions (in addition to those in Table 9)

Min.

Max.

Unit

Input leakage current

(SCL, SDA)

device in Standby mode

-

± 2

µA

Output leakage current

-

± 2

µA

Supply current (Read)

-

0.8

mA

-

2

-

2.5

Supply current (Write)(1)

-

2

mA

Standby supply current

Device not selected, 6

-

1

µA

-

2

-

3

Input low voltage

(SCL, SDA)

-

–0.45

V

Input high voltage

(SCL, SDA)

-

V

Output low voltage

-

0.2

V

-

0.4

V

-

0.4

V

1. Characterized value, not tested in production

2. The device is not selected after power-up, after a read instruction (after the stop condition), or after the completion of the

M24128X-FCU

DC and AC parameters

DS12680 - Rev 2

page 20/35