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STL36N60M6 数据表(PDF) 7 Page - STMicroelectronics |
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STL36N60M6 数据表(HTML) 7 Page - STMicroelectronics |
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7 / 15 page ![]() 3 Test circuits Figure 13. Switching times test circuit for resistive load AM15855v1 VGS PW VD RG RL D.U.T. 2200 µF 3.3 µF VDD GND2 (power) GND1 (driver signal) + Figure 14. Test circuit for gate charge behavior AM15856v1 VDD 47kΩ 1kΩ 47kΩ 2.7kΩ 1kΩ 12V Vi ≤ VGS 2200 µF PW IG=CONST 100Ω 100nF D.U.T. VG GND1 GND2 + Figure 15. Test circuit for inductive load switching and diode recovery times AM15857v1 A D D.U.T. S B G 25Ω A A B B RG G FAST DIODE D S L=100µH µF 3.3 1000 µF VDD GND1 GND2 D.U.T. + Figure 16. Unclamped inductive load test circuit AM15858v1 Vi Pw VD ID D.U.T. L 2200 µF 3.3 µF VDD GND1 GND2 + Figure 17. Unclamped inductive waveform AM01472v1 V(BR)DSS VDD VDD VD IDM ID Figure 18. Switching time waveform AM01473v1 0 VGS 90% VDS 90% 10% 90% 10% 10% ton td(on) tr 0 toff td(off) tf STL36N60M6 Test circuits DS11134 - Rev 4 page 7/15 |
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