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STM32L412R8I3PTR 数据表(PDF) 37 Page - STMicroelectronics |
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STM32L412R8I3PTR 数据表(HTML) 37 Page - STMicroelectronics |
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37 / 192 page ![]() DS12469 Rev 8 37/192 STM32L412xx Functional overview 49 3.15 Analog to digital converter (ADC) The device embeds 2 successive approximation analog-to-digital converter with the following features: • 12-bit native resolution, with built-in calibration • 5.33 Msps maximum conversion rate with full resolution – Down to 18.75 ns sampling time – Increased conversion rate for lower resolution (up to 8.88 Msps for 6-bit resolution) • Up to 16 external channels, some of them shared between ADC1 and ADC2. • 3 internal channels: internal reference voltage, temperature sensor, VBAT/3. • One external reference pin is available on some package, allowing the input voltage range to be independent from the power supply • Single-ended and differential mode inputs • Low-power design – Capable of low-current operation at low conversion rate (consumption decreases linearly with speed) • Highly versatile digital interface – Single-shot or continuous/discontinuous sequencer-based scan mode: 2 groups of analog signals conversions can be programmed to differentiate background and high-priority real-time conversions – Handles two ADC converters for dual mode operation (simultaneous or interleaved sampling modes) – Each ADC supports multiple trigger inputs for synchronization with on-chip timers and external signals – Results stored into 2 data register or in RAM with DMA controller support – Data pre-processing: left/right alignment and per channel offset compensation – Built-in oversampling unit for enhanced SNR – Channel-wise programmable sampling time – Three analog watchdog for automatic voltage monitoring, generating interrupts and trigger for selected timers – Hardware assistant to prepare the context of the injected channels to allow fast context switching 3.15.1 Temperature sensor The temperature sensor (TS) generates a voltage VTS that varies linearly with temperature. The temperature sensor is internally connected to the ADC1_IN17 input channel which is used to convert the sensor output voltage into a digital value. The sensor provides good linearity but it has to be calibrated to obtain good overall accuracy of the temperature measurement. As the offset of the temperature sensor varies from chip to chip due to process variation, the uncalibrated internal temperature sensor is suitable for applications that detect temperature changes only. To improve the accuracy of the temperature sensor measurement, each device is individually factory-calibrated by ST. The temperature sensor factory calibration data are stored by ST in the system memory area, accessible in read-only mode. |
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