ZSC31150 Datasheet

© 2016 Integrated Device Technology, Inc.

8

December 6, 2016

No.

Parameter

Symbol

Conditions

Min

Typ

Max

Unit

1.3.6.10

INL TQE (DAC)

-8

8

LSB

1.3.6.11

Output leak current @150°C

power or ground loss

-25

25

µA

1.3.7

System Response

1.3.7.1

Startup time [d]

no ROM check; ADC 14-bit

and 2nd order

5

ms

1.3.7.2

Response time (100% jump)[a]

refer to Table 2.3

256

512

µs

1.3.7.3

Bandwidth [a]

Comparable to analog SSCs

5

kHz

1.3.7.4

Analog output noise

peak-to-peak [a]

Shorted inputs;

bandwidth

 10kHz

10

mV

1.3.7.5

Analog output noise RMS [a]

Shorted inputs;

bandwidth

 10kHz

3

mV

1.3.7.6

Ratiometricity error

Maximum error of

VDDE=5V to 4.5/5.5V

1000

ppm

1.3.7.7

Overall failure (deviation from

ideal line including the INL,

gain, offset and temperature

errors) [e]

No sensor caused effects;

value in parentheses is the

digital readout.

0.25

(0.1)

% FS

0.5

(0.25)

% FS

1.0

(0.5)

% FS

[a] No measurement in mass production; parameter is guaranteed by design and/or quality observation.

[b] Refer to section 2.4.

[c] Minimum output voltage to VDDE or maximum output voltage to VSSE.

[d] Depends on resolution and configuration - start routine begins approximately 0.8ms after power on.

[e] XZC is active: additional overall failure of 25ppm/K for XZC=31 at maximum; failure decreases linearly for XZC adjustments lower than 31.

1.4 Interface Characteristics and EEPROM

Table 1.4 Interface and EEPROM Characteristics

No.

Parameter

Symbol

Conditions

Min

Typ

Max

Unit

1.4.1

1.4.1.1

Input-high level [b]

0.8

VDDA

1.4.1.2

Input-low level [b],

0.2

VDDA

1.4.1.3

Output-low level [b]

0.15

VDDA

1.4.1.4

SDA load capacitance [b]

400

pF