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Version 1.0 – July 2020 – D1

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3.3 Built-in Self-Test

With the sgp40_measure_test command, users can perform an on-chip self-test for, e.g., in-line or end-of-line production testing.

If this command is called when the sensor is in idle mode, the sensor returns to idle mode after the test (Figure 9). In case this

command is called during VOC measurement mode (i.e., after calling the sgp40_measure_raw command), the hotplate remains

switched on thereafter. After 250 ms, the master can read a fixed data pattern (1 word + CRC byte) to check if the test was

successful or not.

Figure 9 Possible ways of integrating the built-in self-test function.

3.4 Sensor Start-up Behavior

The sensor starts powering-up after reaching the power-up threshold voltage of 1.7 V and enters idle mode after max. 0.6 ms.

In this state, the sensor is ready to receive commands from the master.